Fault coverage-driven incremental test generation (2010)
Source: The Computer Journal Advance Access. Unidade: ICMC
Subjects: ENGENHARIA DE SOFTWARE, SISTEMAS DE INFORMAÇÃO
ABNT
SIMÃO, Adenilso da Silva e PETRENKO, Alexandre. Fault coverage-driven incremental test generation. The Computer Journal Advance Access, v. 53, n. 9, 2010Tradução . . Disponível em: https://doi.org/10.1093/comjnl/bxp073. Acesso em: 27 nov. 2025.APA
Simão, A. da S., & Petrenko, A. (2010). Fault coverage-driven incremental test generation. The Computer Journal Advance Access, 53( 9). doi:10.1093/comjnl/bxp073NLM
Simão A da S, Petrenko A. Fault coverage-driven incremental test generation [Internet]. The Computer Journal Advance Access. 2010 ; 53( 9):[citado 2025 nov. 27 ] Available from: https://doi.org/10.1093/comjnl/bxp073Vancouver
Simão A da S, Petrenko A. Fault coverage-driven incremental test generation [Internet]. The Computer Journal Advance Access. 2010 ; 53( 9):[citado 2025 nov. 27 ] Available from: https://doi.org/10.1093/comjnl/bxp073
