ReP USP - Resultado da busca

Artigo de periodico
Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM (2019)
Huaman, Jose Luis Clabel ; Awan, Iram Taj; Rivera, V. A. G.; Nogueira, I. C.; Silva, Marcelo de Assumpção Pereira da ; Siu Li, Máximo ; Ferreira, S. O.; Marega Junior, Euclydes
Fonte: Applied Surface Science. Unidade: IFSC
Assuntos: EMISSÃO DA LUZ, FILMES FINOS, FLUORESCÊNCIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
HUAMAN, Jose Luis Clabel et al. Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM. Applied Surface Science, v. No 2019, p. 982-993, 2019Tradução . . Disponível em: https://doi.org/10.1016/j.apsusc.2019.07.003. Acesso em: 15 nov. 2025.
APA
Huaman, J. L. C., Awan, I. T., Rivera, V. A. G., Nogueira, I. C., Silva, M. de A. P. da, Siu Li, M., et al. (2019). Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM. Applied Surface Science, No 2019, 982-993. doi:10.1016/j.apsusc.2019.07.003
NLM
Huaman JLC, Awan IT, Rivera VAG, Nogueira IC, Silva M de AP da, Siu Li M, Ferreira SO, Marega Junior E. Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM [Internet]. Applied Surface Science. 2019 ; No 2019 982-993.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1016/j.apsusc.2019.07.003
Vancouver
Huaman JLC, Awan IT, Rivera VAG, Nogueira IC, Silva M de AP da, Siu Li M, Ferreira SO, Marega Junior E. Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM [Internet]. Applied Surface Science. 2019 ; No 2019 982-993.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1016/j.apsusc.2019.07.003
Artigo de periodico
Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy (2008)
Montanari, Bianca; Barbosa, Anne J.; Ribeiro, Sidney J. L.; Messaddeq, Y.; Poirier, Gael; Siu Li, Máximo
Fonte: Applied Surface Science. Unidade: IFSC
Assuntos: FILMES FINOS, ESPECTROSCOPIA RAMAN, VIDRO, TUNGSTÊNIO
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MONTANARI, Bianca et al. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy. Applied Surface Science, v. 254, n. 17, p. 5552-5556, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.apsusc.2008.02.107. Acesso em: 15 nov. 2025.
APA
Montanari, B., Barbosa, A. J., Ribeiro, S. J. L., Messaddeq, Y., Poirier, G., & Siu Li, M. (2008). Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy. Applied Surface Science, 254( 17), 5552-5556. doi:10.1016/j.apsusc.2008.02.107
NLM
Montanari B, Barbosa AJ, Ribeiro SJL, Messaddeq Y, Poirier G, Siu Li M. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy [Internet]. Applied Surface Science. 2008 ; 254( 17): 5552-5556.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1016/j.apsusc.2008.02.107
Vancouver
Montanari B, Barbosa AJ, Ribeiro SJL, Messaddeq Y, Poirier G, Siu Li M. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy [Internet]. Applied Surface Science. 2008 ; 254( 17): 5552-5556.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1016/j.apsusc.2008.02.107
Artigo de periodico
Photoinduced effect in Ga-Ge-S based thin films (2006)
Messaddeq, Sandra Helena; Siu Li, Máximo ; Inoue, S.; Ribeiro, S. J. L.; Messaddeq, Younnes
Fonte: Applied Surface Science. Unidade: IFSC
Assuntos: ÓPTICA, FILMES FINOS, ESPECTROSCOPIA ULTRAVIOLETA, TEMPERATURA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MESSADDEQ, Sandra Helena et al. Photoinduced effect in Ga-Ge-S based thin films. Applied Surface Science, v. 252, n. 24, p. 8738-8744, 2006Tradução . . Acesso em: 15 nov. 2025.
APA
Messaddeq, S. H., Siu Li, M., Inoue, S., Ribeiro, S. J. L., & Messaddeq, Y. (2006). Photoinduced effect in Ga-Ge-S based thin films. Applied Surface Science, 252( 24), 8738-8744.
NLM
Messaddeq SH, Siu Li M, Inoue S, Ribeiro SJL, Messaddeq Y. Photoinduced effect in Ga-Ge-S based thin films. Applied Surface Science. 2006 ; 252( 24): 8738-8744.[citado 2025 nov. 15 ]
Vancouver
Messaddeq SH, Siu Li M, Inoue S, Ribeiro SJL, Messaddeq Y. Photoinduced effect in Ga-Ge-S based thin films. Applied Surface Science. 2006 ; 252( 24): 8738-8744.[citado 2025 nov. 15 ]
Artigo de periodico
The influence of oxygen in the photoexpansion of GaGeS glasses (2003)
Messaddeq, Sandra H.; Mastelaro, Valmor Roberto ; Siu Li, Máximo ; Tabacniks, Manfredo Harri ; Lezal, D.; Ramos, A.; Messaddeq, Y.
Fonte: Applied Surface Science. Unidades: IFSC, IF
Assuntos: ÓPTICA, ESPECTROSCOPIA DE RAIO X, FILMES FINOS, VIDRO
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MESSADDEQ, Sandra H. et al. The influence of oxygen in the photoexpansion of GaGeS glasses. Applied Surface Science, v. 205, n. Ja, p. 143-150, 2003Tradução . . Disponível em: https://doi.org/10.1016/s0169-4332(02)01013-9. Acesso em: 15 nov. 2025.
APA
Messaddeq, S. H., Mastelaro, V. R., Siu Li, M., Tabacniks, M. H., Lezal, D., Ramos, A., & Messaddeq, Y. (2003). The influence of oxygen in the photoexpansion of GaGeS glasses. Applied Surface Science, 205( Ja), 143-150. doi:10.1016/s0169-4332(02)01013-9
NLM
Messaddeq SH, Mastelaro VR, Siu Li M, Tabacniks MH, Lezal D, Ramos A, Messaddeq Y. The influence of oxygen in the photoexpansion of GaGeS glasses [Internet]. Applied Surface Science. 2003 ; 205( Ja): 143-150.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1016/s0169-4332(02)01013-9
Vancouver
Messaddeq SH, Mastelaro VR, Siu Li M, Tabacniks MH, Lezal D, Ramos A, Messaddeq Y. The influence of oxygen in the photoexpansion of GaGeS glasses [Internet]. Applied Surface Science. 2003 ; 205( Ja): 143-150.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1016/s0169-4332(02)01013-9
Artigo de periodico
Analysis of the topography of a Bragg grating in chalcogenide glass (2001)
Messaddeq, Sandra Helena; Siu Li, Máximo ; Werner, U; Messaddeq, Younnes; Lezal, D; Aegerter, Michel André
Fonte: Applied Surface Science. Unidade: IFSC
Assuntos: MATÉRIA CONDENSADA, MATÉRIA CONDENSADA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MESSADDEQ, Sandra Helena et al. Analysis of the topography of a Bragg grating in chalcogenide glass. Applied Surface Science, v. 181, p. 19-27, 2001Tradução . . Disponível em: https://doi.org/10.1016/S0169-4332(01)00337-3. Acesso em: 15 nov. 2025.
APA
Messaddeq, S. H., Siu Li, M., Werner, U., Messaddeq, Y., Lezal, D., & Aegerter, M. A. (2001). Analysis of the topography of a Bragg grating in chalcogenide glass. Applied Surface Science, 181, 19-27. doi:10.1016/S0169-4332(01)00337-3
NLM
Messaddeq SH, Siu Li M, Werner U, Messaddeq Y, Lezal D, Aegerter MA. Analysis of the topography of a Bragg grating in chalcogenide glass [Internet]. Applied Surface Science. 2001 ; 181 19-27.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1016/S0169-4332(01)00337-3
Vancouver
Messaddeq SH, Siu Li M, Werner U, Messaddeq Y, Lezal D, Aegerter MA. Analysis of the topography of a Bragg grating in chalcogenide glass [Internet]. Applied Surface Science. 2001 ; 181 19-27.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1016/S0169-4332(01)00337-3

Unidades USP

ReP

Filtros

Autores

Autores USP

Assuntos

Grupo de pesquisa

Afiliação dos autores externos não normalizada