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Artigo de periodico
Femtosecond laser-induced damage threshold incubation in SrTiO3 thin films (2025)
Paula, Kelly Tasso de ; Huaman, Jose Luis Clabel ; Vieira, Eduardo Vinícius Macedo ; Mastelaro, Valmor Roberto ; Vollet Filho, José Dirceu ; Mendonça, Cleber Renato
Source: Applied Surface Science. Unidade: IFSC
Subjects: LASER, FILMES FINOS, PROPRIEDADES DOS MATERIAIS, ESPECTROSCOPIA RAMAN
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ABNT
PAULA, Kelly Tasso de et al. Femtosecond laser-induced damage threshold incubation in SrTiO3 thin films. Applied Surface Science, v. 680, n. Ja 2025, p. 161340-1-161340-10, 2025Tradução . . Disponível em: https://doi.org/10.1016/j.apsusc.2024.161340. Acesso em: 16 nov. 2025.
APA
Paula, K. T. de, Huaman, J. L. C., Vieira, E. V. M., Mastelaro, V. R., Vollet Filho, J. D., & Mendonça, C. R. (2025). Femtosecond laser-induced damage threshold incubation in SrTiO3 thin films. Applied Surface Science, 680( Ja 2025), 161340-1-161340-10. doi:10.1016/j.apsusc.2024.161340
NLM
Paula KT de, Huaman JLC, Vieira EVM, Mastelaro VR, Vollet Filho JD, Mendonça CR. Femtosecond laser-induced damage threshold incubation in SrTiO3 thin films [Internet]. Applied Surface Science. 2025 ; 680( Ja 2025): 161340-1-161340-10.[citado 2025 nov. 16 ] Available from: https://doi.org/10.1016/j.apsusc.2024.161340
Vancouver
Paula KT de, Huaman JLC, Vieira EVM, Mastelaro VR, Vollet Filho JD, Mendonça CR. Femtosecond laser-induced damage threshold incubation in SrTiO3 thin films [Internet]. Applied Surface Science. 2025 ; 680( Ja 2025): 161340-1-161340-10.[citado 2025 nov. 16 ] Available from: https://doi.org/10.1016/j.apsusc.2024.161340
Artigo de periodico
Use of micrometric latex beads to improve the porosity of hydroxyapatite obtained by chemical coprecipitation method (2018)
Webler, G. D.; Rodrigues, W. C.; Silva, A. E. S.; Silva, A. O. S.; Fonsecae, E. J. S.; Otubo, L.; Barros Filho, D. A.; Degenhardt, M. F. S.; Oliveira, Cristiano Luis Pinto de
Source: Applied Surface Science. Unidade: IF
Subjects: ESPECTROSCOPIA RAMAN, ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS, MÉTODO DE MONTE CARLO
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ABNT
WEBLER, G. D. et al. Use of micrometric latex beads to improve the porosity of hydroxyapatite obtained by chemical coprecipitation method. Applied Surface Science, v. 436, p. 141-151, 2018Tradução . . Disponível em: https://doi.org/10.1016/j.apsusc.2017.11.218. Acesso em: 16 nov. 2025.
APA
Webler, G. D., Rodrigues, W. C., Silva, A. E. S., Silva, A. O. S., Fonsecae, E. J. S., Otubo, L., et al. (2018). Use of micrometric latex beads to improve the porosity of hydroxyapatite obtained by chemical coprecipitation method. Applied Surface Science, 436, 141-151. doi:10.1016/j.apsusc.2017.11.218
NLM
Webler GD, Rodrigues WC, Silva AES, Silva AOS, Fonsecae EJS, Otubo L, Barros Filho DA, Degenhardt MFS, Oliveira CLP de. Use of micrometric latex beads to improve the porosity of hydroxyapatite obtained by chemical coprecipitation method [Internet]. Applied Surface Science. 2018 ; 436 141-151.[citado 2025 nov. 16 ] Available from: https://doi.org/10.1016/j.apsusc.2017.11.218
Vancouver
Webler GD, Rodrigues WC, Silva AES, Silva AOS, Fonsecae EJS, Otubo L, Barros Filho DA, Degenhardt MFS, Oliveira CLP de. Use of micrometric latex beads to improve the porosity of hydroxyapatite obtained by chemical coprecipitation method [Internet]. Applied Surface Science. 2018 ; 436 141-151.[citado 2025 nov. 16 ] Available from: https://doi.org/10.1016/j.apsusc.2017.11.218
Artigo de periodico
Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy (2008)
Montanari, Bianca; Barbosa, Anne J.; Ribeiro, Sidney J. L.; Messaddeq, Y.; Poirier, Gael; Siu Li, Máximo
Source: Applied Surface Science. Unidade: IFSC
Subjects: FILMES FINOS, ESPECTROSCOPIA RAMAN, VIDRO, TUNGSTÊNIO
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ABNT
MONTANARI, Bianca et al. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy. Applied Surface Science, v. 254, n. 17, p. 5552-5556, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.apsusc.2008.02.107. Acesso em: 16 nov. 2025.
APA
Montanari, B., Barbosa, A. J., Ribeiro, S. J. L., Messaddeq, Y., Poirier, G., & Siu Li, M. (2008). Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy. Applied Surface Science, 254( 17), 5552-5556. doi:10.1016/j.apsusc.2008.02.107
NLM
Montanari B, Barbosa AJ, Ribeiro SJL, Messaddeq Y, Poirier G, Siu Li M. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy [Internet]. Applied Surface Science. 2008 ; 254( 17): 5552-5556.[citado 2025 nov. 16 ] Available from: https://doi.org/10.1016/j.apsusc.2008.02.107
Vancouver
Montanari B, Barbosa AJ, Ribeiro SJL, Messaddeq Y, Poirier G, Siu Li M. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy [Internet]. Applied Surface Science. 2008 ; 254( 17): 5552-5556.[citado 2025 nov. 16 ] Available from: https://doi.org/10.1016/j.apsusc.2008.02.107
Artigo de periodico
Thionin adsorption on silicon (100): structural analysis (2006)
Miotto, R; Cunha, J F R; Silva, S W da; Soler, Maria Aparecida Godoy ; Morais, P C; Ferraz, A. C.; Tada, Dayane B; Petri, Denise Freitas Siqueira ; Baptista, Maurício da Silva
Source: Applied Surface Science. Unidades: IF, IQ
Subjects: SUPERFÍCIE FÍSICA, ESPECTROSCOPIA RAMAN
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ABNT
MIOTTO, R et al. Thionin adsorption on silicon (100): structural analysis. Applied Surface Science, v. 253, n. 4, p. 1978-1982, 2006Tradução . . Disponível em: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6THY-4JVSV81-8-21&_cdi=5295&_user=972067&_orig=browse&_coverDate=12%2F15%2F2006&_sk=997469995&view=c&wchp=dGLbVlb-zSkzV&md5=acc94b55ddd7242377aad57aa86d3b8d&ie=/sdarticle.pdf. Acesso em: 16 nov. 2025.
APA
Miotto, R., Cunha, J. F. R., Silva, S. W. da, Soler, M. A. G., Morais, P. C., Ferraz, A. C., et al. (2006). Thionin adsorption on silicon (100): structural analysis. Applied Surface Science, 253( 4), 1978-1982. Recuperado de http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6THY-4JVSV81-8-21&_cdi=5295&_user=972067&_orig=browse&_coverDate=12%2F15%2F2006&_sk=997469995&view=c&wchp=dGLbVlb-zSkzV&md5=acc94b55ddd7242377aad57aa86d3b8d&ie=/sdarticle.pdf
NLM
Miotto R, Cunha JFR, Silva SW da, Soler MAG, Morais PC, Ferraz AC, Tada DB, Petri DFS, Baptista M da S. Thionin adsorption on silicon (100): structural analysis [Internet]. Applied Surface Science. 2006 ; 253( 4): 1978-1982.[citado 2025 nov. 16 ] Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6THY-4JVSV81-8-21&_cdi=5295&_user=972067&_orig=browse&_coverDate=12%2F15%2F2006&_sk=997469995&view=c&wchp=dGLbVlb-zSkzV&md5=acc94b55ddd7242377aad57aa86d3b8d&ie=/sdarticle.pdf
Vancouver
Miotto R, Cunha JFR, Silva SW da, Soler MAG, Morais PC, Ferraz AC, Tada DB, Petri DFS, Baptista M da S. Thionin adsorption on silicon (100): structural analysis [Internet]. Applied Surface Science. 2006 ; 253( 4): 1978-1982.[citado 2025 nov. 16 ] Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6THY-4JVSV81-8-21&_cdi=5295&_user=972067&_orig=browse&_coverDate=12%2F15%2F2006&_sk=997469995&view=c&wchp=dGLbVlb-zSkzV&md5=acc94b55ddd7242377aad57aa86d3b8d&ie=/sdarticle.pdf

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