Pancera, Sabrina Montero; Gliemann, H.; Petri, Denise Freitas Siqueira 
; Schimmel, Thomas
Fonte: Microscopy and Microanalysis. Unidade: IQ
Assuntos: ADSORÇÃO, MICROSCOPIA
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ABNT
PANCERA, Sabrina Montero et al. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis, v. 11, p. 70-73, 2005Tradução . . Acesso em: 15 nov. 2025.APA
Pancera, S. M., Gliemann, H., Petri, D. F. S., & Schimmel, T. (2005). Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis, 11, 70-73.NLM
Pancera SM, Gliemann H, Petri DFS, Schimmel T. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2025 nov. 15 ]Vancouver
Pancera SM, Gliemann H, Petri DFS, Schimmel T. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2025 nov. 15 ]
