An x-ray diffractometer for accurate structural invariant phase determination (2003)
Source: Journal of Synchrotron Radiation. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, CRISTALOGRAFIA
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MORELHÃO, Sérgio Luiz. An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchrotron Radiation, v. 10, p. 236-241, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0909049503003789. Acesso em: 15 out. 2024.APA
Morelhão, S. L. (2003). An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchrotron Radiation, 10, 236-241. doi:10.1107/s0909049503003789NLM
Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchrotron Radiation. 2003 ; 10 236-241.[citado 2024 out. 15 ] Available from: https://doi.org/10.1107/s0909049503003789Vancouver
Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchrotron Radiation. 2003 ; 10 236-241.[citado 2024 out. 15 ] Available from: https://doi.org/10.1107/s0909049503003789
