Source: Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipament. Unidade: IF
Subjects: RAIOS GAMA, DETETORES
ABNT
NASCIMENTO, E do et al. Statistical analysis of the doppler broadening coincidence spectrum of electron-positron annihilation radiation in silicon. Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipament, v. 609, n. 2-3, p. 244-249, 2009Tradução . . Disponível em: https://doi.org/10.1016/j.nima.2009.07.051. Acesso em: 16 ago. 2024.APA
Nascimento, E. do, Helene, O. A. M., Vanin, V. R., Cruz, M. T. F. da, & Moralles, M. (2009). Statistical analysis of the doppler broadening coincidence spectrum of electron-positron annihilation radiation in silicon. Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipament, 609( 2-3), 244-249. doi:10.1016/j.nima.2009.07.051NLM
Nascimento E do, Helene OAM, Vanin VR, Cruz MTF da, Moralles M. Statistical analysis of the doppler broadening coincidence spectrum of electron-positron annihilation radiation in silicon [Internet]. Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipament. 2009 ; 609( 2-3): 244-249.[citado 2024 ago. 16 ] Available from: https://doi.org/10.1016/j.nima.2009.07.051Vancouver
Nascimento E do, Helene OAM, Vanin VR, Cruz MTF da, Moralles M. Statistical analysis of the doppler broadening coincidence spectrum of electron-positron annihilation radiation in silicon [Internet]. Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipament. 2009 ; 609( 2-3): 244-249.[citado 2024 ago. 16 ] Available from: https://doi.org/10.1016/j.nima.2009.07.051