Source: Materials Research Express. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SEMICONDUTORES, CRISTALOGRAFIA DE RAIOS X
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FORNARI, C. I et al. Structural defects and electronic phase diagram of topological insulator bismuth telluride epitaxial films. Materials Research Express, v. no 2018, n. 11, p. 116410, 2018Tradução . . Disponível em: http://iopscience.iop.org/article/10.1088/2053-1591/aadeb7. Acesso em: 12 set. 2024.APA
Fornari, C. I., Rappl, P. H. O., Fornari, G., Travelho, J. S., Castro, S. de, Pirralho, M. J. P., et al. (2018). Structural defects and electronic phase diagram of topological insulator bismuth telluride epitaxial films. Materials Research Express, no 2018( 11), 116410. doi:10.1088/2053-1591/aadeb7NLM
Fornari CI, Rappl PHO, Fornari G, Travelho JS, Castro S de, Pirralho MJP, Pena FS, Peres ML, Abramof E, Morelhao SL. Structural defects and electronic phase diagram of topological insulator bismuth telluride epitaxial films [Internet]. Materials Research Express. 2018 ; no 2018( 11): 116410.[citado 2024 set. 12 ] Available from: http://iopscience.iop.org/article/10.1088/2053-1591/aadeb7Vancouver
Fornari CI, Rappl PHO, Fornari G, Travelho JS, Castro S de, Pirralho MJP, Pena FS, Peres ML, Abramof E, Morelhao SL. Structural defects and electronic phase diagram of topological insulator bismuth telluride epitaxial films [Internet]. Materials Research Express. 2018 ; no 2018( 11): 116410.[citado 2024 set. 12 ] Available from: http://iopscience.iop.org/article/10.1088/2053-1591/aadeb7
