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Filtros : "World Scientific Publishing" "INFERÊNCIA BAYESIANA" Limpar

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  • Trabalho de evento

    Statistical information: a bayesian perspective (2011)

    Stern, Rafael Bassi ; Pereira, Carlos Alberto de Bragança

    Source: Science : image in action. Conference titles: International Workshop on Data Analysis in Astronomy “Livio Scarsi and Vito DiGesù”. Unidade: IME

    Assunto: INFERÊNCIA BAYESIANA

    Acesso à fonteDOIHow to cite
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    • ABNT

      STERN, Rafael Bassi e PEREIRA, Carlos Alberto de Bragança. Statistical information: a bayesian perspective. 2011, Anais.. Singapura: World Scientific Publishing, 2011. Disponível em: https://doi.org/10.1142/9789814383295_0001. Acesso em: 06 nov. 2024.

    • APA

      Stern, R. B., & Pereira, C. A. de B. (2011). Statistical information: a bayesian perspective. In Science : image in action. Singapura: World Scientific Publishing. doi:10.1142/9789814383295_0001

    • NLM

      Stern RB, Pereira CA de B. Statistical information: a bayesian perspective [Internet]. Science : image in action. 2011 ;[citado 2024 nov. 06 ] Available from: https://doi.org/10.1142/9789814383295_0001

    • Vancouver

      Stern RB, Pereira CA de B. Statistical information: a bayesian perspective [Internet]. Science : image in action. 2011 ;[citado 2024 nov. 06 ] Available from: https://doi.org/10.1142/9789814383295_0001

  • Parte de monografia/livro

    A Weibull wearout test: full Bayesian approach (2001)

    Irony, Telba Zalkind; Lauretto, Marcelo de Souza; Pereira, Carlos Alberto de Bragança ; Stern, Julio Michael

    Source: System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday. Unidade: IME

    Subjects: INFERÊNCIA BAYESIANA, ANÁLISE DE SOBREVIVÊNCIA

    Acesso à fonteAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      IRONY, Telba Zalkind et al. A Weibull wearout test: full Bayesian approach. System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday. Tradução . River Edge, NJ: World Scientific Publishing, 2001. . Disponível em: https://doi-org.ez67.periodicos.capes.gov.br/10.1142/9789812799548_0017. Acesso em: 06 nov. 2024.

    • APA

      Irony, T. Z., Lauretto, M. de S., Pereira, C. A. de B., & Stern, J. M. (2001). A Weibull wearout test: full Bayesian approach. In System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday. River Edge, NJ: World Scientific Publishing. doi:10.1142/9789812799548_0017

    • NLM

      Irony TZ, Lauretto M de S, Pereira CA de B, Stern JM. A Weibull wearout test: full Bayesian approach [Internet]. In: System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday. River Edge, NJ: World Scientific Publishing; 2001. [citado 2024 nov. 06 ] Available from: https://doi-org.ez67.periodicos.capes.gov.br/10.1142/9789812799548_0017

    • Vancouver

      Irony TZ, Lauretto M de S, Pereira CA de B, Stern JM. A Weibull wearout test: full Bayesian approach [Internet]. In: System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday. River Edge, NJ: World Scientific Publishing; 2001. [citado 2024 nov. 06 ] Available from: https://doi-org.ez67.periodicos.capes.gov.br/10.1142/9789812799548_0017
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