A Weibull wearout test: full Bayesian approach (2001)
- Authors:
- USP affiliated authors: PEREIRA, CARLOS ALBERTO DE BRAGANCA - IME ; STERN, JULIO MICHAEL - IME
- Unidade: IME
- DOI: 10.1142/9789812799548_0017
- Subjects: INFERÊNCIA BAYESIANA; ANÁLISE DE SOBREVIVÊNCIA
- Language: Inglês
- Imprenta:
- Publisher: World Scientific Publishing
- Publisher place: New Jersey
- Date published: 2001
- Source:
- Este artigo possui versão em acesso aberto
- URL de acesso aberto
- Versão do Documento: Versão submetida (Pré-print)
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Status: Artigo possui versão em acesso aberto em repositório (Green Open Access) -
ABNT
IRONY, Telba Zalkind et al. A Weibull wearout test: full Bayesian approach. System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday. Tradução . New Jersey: World Scientific Publishing, 2001. . Disponível em: https://doi-org.ez67.periodicos.capes.gov.br/10.1142/9789812799548_0017. Acesso em: 14 mar. 2026. -
APA
Irony, T. Z., Lauretto, M. de S., Pereira, C. A. de B., & Stern, J. M. (2001). A Weibull wearout test: full Bayesian approach. In System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday. New Jersey: World Scientific Publishing. doi:10.1142/9789812799548_0017 -
NLM
Irony TZ, Lauretto M de S, Pereira CA de B, Stern JM. A Weibull wearout test: full Bayesian approach [Internet]. In: System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday. New Jersey: World Scientific Publishing; 2001. [citado 2026 mar. 14 ] Available from: https://doi-org.ez67.periodicos.capes.gov.br/10.1142/9789812799548_0017 -
Vancouver
Irony TZ, Lauretto M de S, Pereira CA de B, Stern JM. A Weibull wearout test: full Bayesian approach [Internet]. In: System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday. New Jersey: World Scientific Publishing; 2001. [citado 2026 mar. 14 ] Available from: https://doi-org.ez67.periodicos.capes.gov.br/10.1142/9789812799548_0017 - E‐value
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