Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy (2005)
Fonte: Microscopy and Microanalysis. Nome do evento: Latin American Symposium on Scanning Probe Microscopy - LASPM. Unidade: IFSC
Assuntos: ESPECTROSCOPIA ATÔMICA, NANOTECNOLOGIA, SILÍCIO
ABNT
LEITE, F. L. et al. Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. New York: Cambridge University Press. . Acesso em: 16 ago. 2024. , 2005APA
Leite, F. L., Ziemath, E. C., Oliveira Junior, O. N. de, & Herrmann, P. S. P. (2005). Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. New York: Cambridge University Press.NLM
Leite FL, Ziemath EC, Oliveira Junior ON de, Herrmann PSP. Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. 2005 ; 11 130-133.[citado 2024 ago. 16 ]Vancouver
Leite FL, Ziemath EC, Oliveira Junior ON de, Herrmann PSP. Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. 2005 ; 11 130-133.[citado 2024 ago. 16 ]