Measurement of critical exponents of platinum thin films (2003)
Source: Surface Review and Letters. Unidade: IF
Subjects: MICROSCOPIA ELETRÔNICA, FILMES FINOS, SUPERFÍCIE FÍSICA
ABNT
SALVADORI, Maria Cecília Barbosa da Silveira et al. Measurement of critical exponents of platinum thin films. Surface Review and Letters, v. 10, n. 1, p. 1-5, 2003Tradução . . Disponível em: http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf. Acesso em: 20 out. 2024.APA
Salvadori, M. C. B. da S., Melo, L. L., Cattani, M. S. D., Monteiro, O. R., & Brown, L. G. (2003). Measurement of critical exponents of platinum thin films. Surface Review and Letters, 10( 1), 1-5. Recuperado de http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdfNLM
Salvadori MCB da S, Melo LL, Cattani MSD, Monteiro OR, Brown LG. Measurement of critical exponents of platinum thin films [Internet]. Surface Review and Letters. 2003 ; 10( 1): 1-5.[citado 2024 out. 20 ] Available from: http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdfVancouver
Salvadori MCB da S, Melo LL, Cattani MSD, Monteiro OR, Brown LG. Measurement of critical exponents of platinum thin films [Internet]. Surface Review and Letters. 2003 ; 10( 1): 1-5.[citado 2024 out. 20 ] Available from: http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf