Piantini, Alexandre 
; Pereira, A; Kameyama, F; Mello, D R; Teixeira Junior, J A
Source: Proceedings. Conference titles: International Conference on Properties and Applications of Dielectrics Materials. Unidade: IEE
Assunto: SISTEMAS ELÉTRICOS DE POTÊNCIA
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PIANTINI, Alexandre et al. Applications of the new approach of atmosferic correction factors to tests performed on post insulators. 1988, Anais.. Japan: Institute of Electrical and Electronics Engineers, 1988. . Acesso em: 07 nov. 2024.APA
Piantini, A., Pereira, A., Kameyama, F., Mello, D. R., & Teixeira Junior, J. A. (1988). Applications of the new approach of atmosferic correction factors to tests performed on post insulators. In Proceedings. Japan: Institute of Electrical and Electronics Engineers.NLM
Piantini A, Pereira A, Kameyama F, Mello DR, Teixeira Junior JA. Applications of the new approach of atmosferic correction factors to tests performed on post insulators. Proceedings. 1988 ;[citado 2024 nov. 07 ]Vancouver
Piantini A, Pereira A, Kameyama F, Mello DR, Teixeira Junior JA. Applications of the new approach of atmosferic correction factors to tests performed on post insulators. Proceedings. 1988 ;[citado 2024 nov. 07 ]
