Applications of the new approach of atmosferic correction factors to tests performed on post insulators

Applications of the new approach of atmosferic correction factors to tests performed on post insulators (1988)

Authors:
USP affiliated authors: KAMEYAMA, FRANCISCO HIRAKAZU - IEE ; PIANTINI, ALEXANDRE - IEE
Unidade: IEE
Assunto: SISTEMAS ELÉTRICOS DE POTÊNCIA
Language: Português
Imprenta:
- Publisher: Institute of Electrical and Electronics Engineers
- Publisher place: Japan
- Date published: 1988
Source:
- Título: Proceedings
Conference titles: International Conference on Properties and Applications of Dielectrics Materials

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ABNT

PIANTINI, Alexandre et al. Applications of the new approach of atmosferic correction factors to tests performed on post insulators. 1988, Anais.. Japan: Institute of Electrical and Electronics Engineers, 1988. . Acesso em: 11 abr. 2026.
APA

Piantini, A., Pereira, A., Kameyama, F., Mello, D. R., & Teixeira Junior, J. A. (1988). Applications of the new approach of atmosferic correction factors to tests performed on post insulators. In Proceedings. Japan: Institute of Electrical and Electronics Engineers.
NLM

Piantini A, Pereira A, Kameyama F, Mello DR, Teixeira Junior JA. Applications of the new approach of atmosferic correction factors to tests performed on post insulators. Proceedings. 1988 ;[citado 2026 abr. 11 ]
Vancouver

Piantini A, Pereira A, Kameyama F, Mello DR, Teixeira Junior JA. Applications of the new approach of atmosferic correction factors to tests performed on post insulators. Proceedings. 1988 ;[citado 2026 abr. 11 ]