Raman spectroscopy and AFM analysis of low temperature c: H films (1998)
Source: SBMicro - ICMP'98 : proceedings. Conference titles: International Conference on Microelectronics and Packaging. Unidades: EP, IFSC
Subjects: CIRCUITOS INTEGRADOS, ESPECTROSCOPIA, BAIXA TEMPERATURA
ABNT
DIRANI, Ely Antonio Tadeu et al. Raman spectroscopy and AFM analysis of low temperature c: H films. 1998, Anais.. Curitiba: LACTRO/LAC, 1998. . Acesso em: 18 ago. 2024.APA
Dirani, E. A. T., Faria, R. M., Fonseca, F. J., & Andrade, A. M. de. (1998). Raman spectroscopy and AFM analysis of low temperature c: H films. In SBMicro - ICMP'98 : proceedings. Curitiba: LACTRO/LAC.NLM
Dirani EAT, Faria RM, Fonseca FJ, Andrade AM de. Raman spectroscopy and AFM analysis of low temperature c: H films. SBMicro - ICMP'98 : proceedings. 1998 ;[citado 2024 ago. 18 ]Vancouver
Dirani EAT, Faria RM, Fonseca FJ, Andrade AM de. Raman spectroscopy and AFM analysis of low temperature c: H films. SBMicro - ICMP'98 : proceedings. 1998 ;[citado 2024 ago. 18 ]