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ABNT
GURGEL, Ivã e PRESTES, Maria Elice Brzezinski. Conferência Latinoamericana do International History, Philosophy and Science Teaching Group - IHPST-LA, 5. . Porto Alegre: Universidade de Passo Fundo - UPF. . Acesso em: 03 out. 2024. , 2023
APA
Gurgel, I., & Prestes, M. E. B. (2023). Conferência Latinoamericana do International History, Philosophy and Science Teaching Group - IHPST-LA, 5. Porto Alegre: Universidade de Passo Fundo - UPF.
NLM
Gurgel I, Prestes MEB. Conferência Latinoamericana do International History, Philosophy and Science Teaching Group - IHPST-LA, 5. 2023 ;[citado 2024 out. 03 ]
Vancouver
Gurgel I, Prestes MEB. Conferência Latinoamericana do International History, Philosophy and Science Teaching Group - IHPST-LA, 5. 2023 ;[citado 2024 out. 03 ]
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
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BENITES, Luis A. C. et al. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, v. 66 , n. 7, p. 1433-1440, 2019Tradução . . Disponível em: https://doi.org/10.1109/TNS.2019.2921796. Acesso em: 03 out. 2024.
APA
Benites, L. A. C., Benevenuti, F., Oliveira, A. B. de, Kastensmidt, F. L., Added, N., Aguiar, V. Â. P. de, et al. (2019). Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, 66 ( 7), 1433-1440. doi:10.1109/TNS.2019.2921796
NLM
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.[citado 2024 out. 03 ] Available from: https://doi.org/10.1109/TNS.2019.2921796
Vancouver
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.[citado 2024 out. 03 ] Available from: https://doi.org/10.1109/TNS.2019.2921796
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
JAHNKE, Viktor et al. Electron impact inner shell ionization cross-section measurements at 2 MeV. 2011, Anais.. Foz do Iguaçu: SBF, 2011. Disponível em: http://www.sbf1.sbfisica.org.br/eventos/enf/2011/sys/resumos/R2496-1.pdf. Acesso em: 03 out. 2024.
APA
Jahnke, V., Maidana, N. L., Vanin, V. R., Rizzutto, M. A., Gouveia, D. A., Fiorini, T., et al. (2011). Electron impact inner shell ionization cross-section measurements at 2 MeV. In Resumo. Foz do Iguaçu: SBF. Recuperado de http://www.sbf1.sbfisica.org.br/eventos/enf/2011/sys/resumos/R2496-1.pdf
NLM
Jahnke V, Maidana NL, Vanin VR, Rizzutto MA, Gouveia DA, Fiorini T, Lima RR, Fernandez-Varea JM. Electron impact inner shell ionization cross-section measurements at 2 MeV [Internet]. Resumo. 2011 ;[citado 2024 out. 03 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/enf/2011/sys/resumos/R2496-1.pdf
Vancouver
Jahnke V, Maidana NL, Vanin VR, Rizzutto MA, Gouveia DA, Fiorini T, Lima RR, Fernandez-Varea JM. Electron impact inner shell ionization cross-section measurements at 2 MeV [Internet]. Resumo. 2011 ;[citado 2024 out. 03 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/enf/2011/sys/resumos/R2496-1.pdf
; Gurgel, Ivã 
