Source: Journal of Non-Crystalline Solids. Unidades: EP, IQ
Subjects: FÍSICO-QUÍMICA, ESPECTROSCOPIA RAMAN, PLASMA
ABNT
DIRANI, Ely Antonio Tadeu et al. Effect of the substrate on the structural properties of low temperature microcrystalline silicon films - a Raman spectroscopy and atomic force microscopy investigation. Journal of Non-Crystalline Solids, v. 273, n. 1/3, p. 307-313, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0022-3093(00)00177-0. Acesso em: 02 ago. 2024.APA
Dirani, E. A. T., Andrade, A. M. de, Noda, L. K., Fonseca, F. J., & Santos, P. S. (2000). Effect of the substrate on the structural properties of low temperature microcrystalline silicon films - a Raman spectroscopy and atomic force microscopy investigation. Journal of Non-Crystalline Solids, 273( 1/3), 307-313. doi:10.1016/s0022-3093(00)00177-0NLM
Dirani EAT, Andrade AM de, Noda LK, Fonseca FJ, Santos PS. Effect of the substrate on the structural properties of low temperature microcrystalline silicon films - a Raman spectroscopy and atomic force microscopy investigation [Internet]. Journal of Non-Crystalline Solids. 2000 ; 273( 1/3): 307-313.[citado 2024 ago. 02 ] Available from: https://doi.org/10.1016/s0022-3093(00)00177-0Vancouver
Dirani EAT, Andrade AM de, Noda LK, Fonseca FJ, Santos PS. Effect of the substrate on the structural properties of low temperature microcrystalline silicon films - a Raman spectroscopy and atomic force microscopy investigation [Internet]. Journal of Non-Crystalline Solids. 2000 ; 273( 1/3): 307-313.[citado 2024 ago. 02 ] Available from: https://doi.org/10.1016/s0022-3093(00)00177-0