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Filtros : "Instituto Nokia de Tecnologia" "MONLEVADE, EDUARDO FRANCO DE" Limpar

Filtros

Artigo de periodico
A critical analysis of a reliability study of ball grid array electronic components submitted to thermal aging and board-level drop test (2021)
Monlevade, Eduardo Franco de ; Cardoso, Idélcio Alexandre Palheta; Souza, Gilberto Francisco Martha de
Source: Engineering Failure Analysis. Unidade: EP
Subjects: CIRCUITOS IMPRESSOS, RESISTÊNCIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MONLEVADE, Eduardo Franco de e CARDOSO, Idélcio Alexandre Palheta e SOUZA, Gilberto Francisco Martha de. A critical analysis of a reliability study of ball grid array electronic components submitted to thermal aging and board-level drop test. Engineering Failure Analysis, v. 128, p. 1-18, 2021Tradução . . Disponível em: https://doi.org/10.1016/j.engfailanal.2021.105578. Acesso em: 11 set. 2024.
APA
Monlevade, E. F. de, Cardoso, I. A. P., & Souza, G. F. M. de. (2021). A critical analysis of a reliability study of ball grid array electronic components submitted to thermal aging and board-level drop test. Engineering Failure Analysis, 128, 1-18. doi:10.1016/j.engfailanal.2021.105578
NLM
Monlevade EF de, Cardoso IAP, Souza GFM de. A critical analysis of a reliability study of ball grid array electronic components submitted to thermal aging and board-level drop test [Internet]. Engineering Failure Analysis. 2021 ;128 1-18.[citado 2024 set. 11 ] Available from: https://doi.org/10.1016/j.engfailanal.2021.105578
Vancouver
Monlevade EF de, Cardoso IAP, Souza GFM de. A critical analysis of a reliability study of ball grid array electronic components submitted to thermal aging and board-level drop test [Internet]. Engineering Failure Analysis. 2021 ;128 1-18.[citado 2024 set. 11 ] Available from: https://doi.org/10.1016/j.engfailanal.2021.105578
Artigo de periodico
Galvanic corrosion of electroless nickel/immersion gold plated non-permanent electric contacts used in electronic devices–direct evidence of triggering mechanism (2019)
Monlevade, Eduardo Franco de ; Cardoso, I A P; Maciel, E F L; Alonso-Falleiros, Neusa
Source: Engineering Failure Analysis. Unidade: EP
Assunto: CORROSÃO GALVÂNICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MONLEVADE, Eduardo Franco de et al. Galvanic corrosion of electroless nickel/immersion gold plated non-permanent electric contacts used in electronic devices–direct evidence of triggering mechanism. Engineering Failure Analysis, v. 96, p. 562-569, 2019Tradução . . Disponível em: https://doi.org/10.1016/j.engfailanal.2018.12.001. Acesso em: 11 set. 2024.
APA
Monlevade, E. F. de, Cardoso, I. A. P., Maciel, E. F. L., & Alonso-Falleiros, N. (2019). Galvanic corrosion of electroless nickel/immersion gold plated non-permanent electric contacts used in electronic devices–direct evidence of triggering mechanism. Engineering Failure Analysis, 96, 562-569. doi:10.1016/j.engfailanal.2018.12.001
NLM
Monlevade EF de, Cardoso IAP, Maciel EFL, Alonso-Falleiros N. Galvanic corrosion of electroless nickel/immersion gold plated non-permanent electric contacts used in electronic devices–direct evidence of triggering mechanism [Internet]. Engineering Failure Analysis. 2019 ; 96 562-569.[citado 2024 set. 11 ] Available from: https://doi.org/10.1016/j.engfailanal.2018.12.001
Vancouver
Monlevade EF de, Cardoso IAP, Maciel EFL, Alonso-Falleiros N. Galvanic corrosion of electroless nickel/immersion gold plated non-permanent electric contacts used in electronic devices–direct evidence of triggering mechanism [Internet]. Engineering Failure Analysis. 2019 ; 96 562-569.[citado 2024 set. 11 ] Available from: https://doi.org/10.1016/j.engfailanal.2018.12.001

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