Quantitative depth profile study of polyaniline films by photothermal spectroscopies (2007)
Source: Applied Physics A. Unidade: IFSC
Subjects: ÓPTICA, ESPECTROSCOPIA, FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ALBUQUERQUE, J. E. e BALOGH, Débora Terezia e FARIA, Roberto Mendonça. Quantitative depth profile study of polyaniline films by photothermal spectroscopies. Applied Physics A, v. 86, n. 3, p. 395-401, 2007Tradução . . Disponível em: https://doi.org/10.1007/s00339-006-3789-4. Acesso em: 03 jul. 2024.APA
Albuquerque, J. E., Balogh, D. T., & Faria, R. M. (2007). Quantitative depth profile study of polyaniline films by photothermal spectroscopies. Applied Physics A, 86( 3), 395-401. doi:10.1007/s00339-006-3789-4NLM
Albuquerque JE, Balogh DT, Faria RM. Quantitative depth profile study of polyaniline films by photothermal spectroscopies [Internet]. Applied Physics A. 2007 ; 86( 3): 395-401.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1007/s00339-006-3789-4Vancouver
Albuquerque JE, Balogh DT, Faria RM. Quantitative depth profile study of polyaniline films by photothermal spectroscopies [Internet]. Applied Physics A. 2007 ; 86( 3): 395-401.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1007/s00339-006-3789-4
