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Filtros : "FILMES FINOS" "Canadá" Removido: "IFSC" Limpar

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  • Artigo de periodico

    Surface Relief Grating on Chitosan-N,N-dimethyl-4-(2- pyridylazo)aniline Thin Film (2022)

    Atmah, Nadiyah Rashed Al; Caliman, Willian Robert ; Pawlicka, Agnieszka ; Sabat, Ribal Georges; Nunzi, Jean-Miche

    Source: Polymers. Unidade: IQSC

    Subjects: QUITOSANA, CORANTES, FILMES FINOS, POLÍMEROS (QUÍMICA ORGÂNICA)

    PrivadoAcesso à fonteDOIHow to cite
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    • ABNT

      ATMAH, Nadiyah Rashed Al et al. Surface Relief Grating on Chitosan-N,N-dimethyl-4-(2- pyridylazo)aniline Thin Film. Polymers, v. 14, p. 791, 2022Tradução . . Disponível em: https://doi.org/10.3390/polym14040791. Acesso em: 10 out. 2024.

    • APA

      Atmah, N. R. A., Caliman, W. R., Pawlicka, A., Sabat, R. G., & Nunzi, J. -M. (2022). Surface Relief Grating on Chitosan-N,N-dimethyl-4-(2- pyridylazo)aniline Thin Film. Polymers, 14, 791. doi:10.3390/polym14040791

    • NLM

      Atmah NRA, Caliman WR, Pawlicka A, Sabat RG, Nunzi J-M. Surface Relief Grating on Chitosan-N,N-dimethyl-4-(2- pyridylazo)aniline Thin Film [Internet]. Polymers. 2022 ;14 791.[citado 2024 out. 10 ] Available from: https://doi.org/10.3390/polym14040791

    • Vancouver

      Atmah NRA, Caliman WR, Pawlicka A, Sabat RG, Nunzi J-M. Surface Relief Grating on Chitosan-N,N-dimethyl-4-(2- pyridylazo)aniline Thin Film [Internet]. Polymers. 2022 ;14 791.[citado 2024 out. 10 ] Available from: https://doi.org/10.3390/polym14040791

  • Relatorio tecnico

    Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators (2020)

    Fornari, Celso I; Abramof, Eduardo; Rappl, Paulo H O; Kycia, Stefan W; Morelhão, Sergio Luiz

    Unidade: IF

    Subjects: FILMES FINOS, BISMUTO

    Acesso à fonteHow to cite
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    • ABNT

      FORNARI, Celso I et al. Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/ftp/arxiv/papers/2008/2008.02180.pdf. Acesso em: 10 out. 2024. , 2020

    • APA

      Fornari, C. I., Abramof, E., Rappl, P. H. O., Kycia, S. W., & Morelhão, S. L. (2020). Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/ftp/arxiv/papers/2008/2008.02180.pdf

    • NLM

      Fornari CI, Abramof E, Rappl PHO, Kycia SW, Morelhão SL. Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators [Internet]. 2020 ;[citado 2024 out. 10 ] Available from: https://arxiv.org/ftp/arxiv/papers/2008/2008.02180.pdf

    • Vancouver

      Fornari CI, Abramof E, Rappl PHO, Kycia SW, Morelhão SL. Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators [Internet]. 2020 ;[citado 2024 out. 10 ] Available from: https://arxiv.org/ftp/arxiv/papers/2008/2008.02180.pdf
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