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Filtros : "Indexado no Engineering Index" "MARTINO, JOAO ANTONIO" Removidos: "FCF-FBF" "2024" Limpar

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  • Artigo de periodico

    Analog circuit design using graded-channel silicon-on-insulator nMOSFETs (2002)

    Pavanello, Marcelo Antonio ; Martino, João Antonio ; Flandre, Denis

    Source: Solid-State Electronics. Unidade: EP

    Assunto: CIRCUITOS ANALÓGICOS

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      PAVANELLO, Marcelo Antonio e MARTINO, João Antonio e FLANDRE, Denis. Analog circuit design using graded-channel silicon-on-insulator nMOSFETs. Solid-State Electronics, v. 46, n. 8, p. 1215-1225, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0038-1101(02)00020-5. Acesso em: 18 ago. 2024.

    • APA

      Pavanello, M. A., Martino, J. A., & Flandre, D. (2002). Analog circuit design using graded-channel silicon-on-insulator nMOSFETs. Solid-State Electronics, 46( 8), 1215-1225. doi:10.1016/s0038-1101(02)00020-5

    • NLM

      Pavanello MA, Martino JA, Flandre D. Analog circuit design using graded-channel silicon-on-insulator nMOSFETs [Internet]. Solid-State Electronics. 2002 ; 46( 8): 1215-1225.[citado 2024 ago. 18 ] Available from: https://doi.org/10.1016/s0038-1101(02)00020-5

    • Vancouver

      Pavanello MA, Martino JA, Flandre D. Analog circuit design using graded-channel silicon-on-insulator nMOSFETs [Internet]. Solid-State Electronics. 2002 ; 46( 8): 1215-1225.[citado 2024 ago. 18 ] Available from: https://doi.org/10.1016/s0038-1101(02)00020-5

  • Artigo de periodico

    Physical and electrical characterization of thin nickel films obtained from electroless plating onto aluminum (2001)

    Marques, Angelo Eduardo Battistini; Santos Filho, Sebastião Gomes dos ; Navia, Alan Rodrigo; Sonnenberg, Victor ; Martino, João Antonio

    Source: Physica Status Solidi. Unidade: EP

    Assunto: FILMES FINOS (CARACTERÍSTICAS)

    Acesso à fonteAcesso à fonteDOIHow to cite
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    • ABNT

      MARQUES, Angelo Eduardo Battistini et al. Physical and electrical characterization of thin nickel films obtained from electroless plating onto aluminum. Physica Status Solidi, v. 187, n. 1, p. 75-84, 2001Tradução . . Disponível em: https://doi.org/10.1002/1521-396x(200109)187:1<75::aid-pssa75>3.0.co;2-q. Acesso em: 18 ago. 2024.

    • APA

      Marques, A. E. B., Santos Filho, S. G. dos, Navia, A. R., Sonnenberg, V., & Martino, J. A. (2001). Physical and electrical characterization of thin nickel films obtained from electroless plating onto aluminum. Physica Status Solidi, 187( 1), 75-84. doi:10.1002/1521-396x(200109)187:1<75::aid-pssa75>3.0.co;2-q

    • NLM

      Marques AEB, Santos Filho SG dos, Navia AR, Sonnenberg V, Martino JA. Physical and electrical characterization of thin nickel films obtained from electroless plating onto aluminum [Internet]. Physica Status Solidi. 2001 ; 187( 1): 75-84.[citado 2024 ago. 18 ] Available from: https://doi.org/10.1002/1521-396x(200109)187:1<75::aid-pssa75>3.0.co;2-q

    • Vancouver

      Marques AEB, Santos Filho SG dos, Navia AR, Sonnenberg V, Martino JA. Physical and electrical characterization of thin nickel films obtained from electroless plating onto aluminum [Internet]. Physica Status Solidi. 2001 ; 187( 1): 75-84.[citado 2024 ago. 18 ] Available from: https://doi.org/10.1002/1521-396x(200109)187:1<75::aid-pssa75>3.0.co;2-q
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