Scanning electron microscopy (2017)
Source: Nanocharacterization techniques. Unidade: IFSC
Subjects: NANOTECNOLOGIA, ESPECTROSCOPIA, MICROANÁLISE
ABNT
SILVA, Marcelo de Assumpção Pereira da e FERRI, Fabio A. Scanning electron microscopy. Nanocharacterization techniques. Tradução . Amsterdam: Elsevier, 2017. . Disponível em: https://doi.org/10.1016/B978-0-323-49778-7.00001-1. Acesso em: 05 out. 2024.APA
Silva, M. de A. P. da, & Ferri, F. A. (2017). Scanning electron microscopy. In Nanocharacterization techniques. Amsterdam: Elsevier. doi:10.1016/B978-0-323-49778-7.00001-1NLM
Silva M de AP da, Ferri FA. Scanning electron microscopy [Internet]. In: Nanocharacterization techniques. Amsterdam: Elsevier; 2017. [citado 2024 out. 05 ] Available from: https://doi.org/10.1016/B978-0-323-49778-7.00001-1Vancouver
Silva M de AP da, Ferri FA. Scanning electron microscopy [Internet]. In: Nanocharacterization techniques. Amsterdam: Elsevier; 2017. [citado 2024 out. 05 ] Available from: https://doi.org/10.1016/B978-0-323-49778-7.00001-1