Simple method to extract the length dependent mobility degradation factor at 77 K (1997)
Fonte: 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Nome do evento: Symposium Low Temperature Electronics and High Temperature Superconductivity. Unidade: EP
Assuntos: CIRCUITOS INTEGRADOS, MICROELETRÔNICA
ABNT
NICOLETT, Aparecido Sirley et al. Simple method to extract the length dependent mobility degradation factor at 77 K. 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Tradução . Pennington: The Electrochemical Society, 1997. . . Acesso em: 19 ago. 2024.APA
Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (1997). Simple method to extract the length dependent mobility degradation factor at 77 K. In 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Pennington: The Electrochemical Society.NLM
Nicolett AS, Martino JA, Simoen E, Claeys C. Simple method to extract the length dependent mobility degradation factor at 77 K. In: 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Pennington: The Electrochemical Society; 1997. [citado 2024 ago. 19 ]Vancouver
Nicolett AS, Martino JA, Simoen E, Claeys C. Simple method to extract the length dependent mobility degradation factor at 77 K. In: 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Pennington: The Electrochemical Society; 1997. [citado 2024 ago. 19 ]