Source: Journal of Applied Cristalography. Unidade: IF
Subjects: CRISTALOGRAFIA, FILMES FINOS
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RIZZATO, Alessandro P et al. Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures. Journal of Applied Cristalography, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0021889803004953. Acesso em: 10 out. 2024.APA
Rizzato, A. P., Santilli, C. V., Pulcinelli, S. H., & Craievich, A. F. (2003). Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures. Journal of Applied Cristalography. doi:10.1107/s0021889803004953NLM
Rizzato AP, Santilli CV, Pulcinelli SH, Craievich AF. Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures [Internet]. Journal of Applied Cristalography. 2003 ;[citado 2024 out. 10 ] Available from: https://doi.org/10.1107/s0021889803004953Vancouver
Rizzato AP, Santilli CV, Pulcinelli SH, Craievich AF. Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures [Internet]. Journal of Applied Cristalography. 2003 ;[citado 2024 out. 10 ] Available from: https://doi.org/10.1107/s0021889803004953
