Fonte: IEEE Transactions on Nanotechnology. Unidade: EESC
Assuntos: TRANSISTORES, ENGENHARIA ELÉTRICA
ABNT
RAGI, Regiane e ROMERO, Murilo Araujo. Fully analytical compact model for the I–V characteristics of large radius junctionless nanowire FETs. IEEE Transactions on Nanotechnology, v. 18, n. 1, p. 762-769, 2019Tradução . . Disponível em: https://doi.org/10.1109/TNANO.2019.2926041. Acesso em: 30 jun. 2025.APA
Ragi, R., & Romero, M. A. (2019). Fully analytical compact model for the I–V characteristics of large radius junctionless nanowire FETs. IEEE Transactions on Nanotechnology, 18( 1), 762-769. doi:10.1109/TNANO.2019.2926041NLM
Ragi R, Romero MA. Fully analytical compact model for the I–V characteristics of large radius junctionless nanowire FETs [Internet]. IEEE Transactions on Nanotechnology. 2019 ; 18( 1): 762-769.[citado 2025 jun. 30 ] Available from: https://doi.org/10.1109/TNANO.2019.2926041Vancouver
Ragi R, Romero MA. Fully analytical compact model for the I–V characteristics of large radius junctionless nanowire FETs [Internet]. IEEE Transactions on Nanotechnology. 2019 ; 18( 1): 762-769.[citado 2025 jun. 30 ] Available from: https://doi.org/10.1109/TNANO.2019.2926041