New method for studying semiconducting surfaces in air by scanning tunneling microscopy (1997)
Source: Modern Physics Letters B. Unidade: IF
Assunto: SEMICONDUTORES
ABNT
FERLAUTO, A S e QUIVY, A. A. New method for studying semiconducting surfaces in air by scanning tunneling microscopy. Modern Physics Letters B, v. 10, n. 24, p. 1189-1195, 1997Tradução . . Acesso em: 03 ago. 2024.APA
Ferlauto, A. S., & Quivy, A. A. (1997). New method for studying semiconducting surfaces in air by scanning tunneling microscopy. Modern Physics Letters B, 10( 24), 1189-1195.NLM
Ferlauto AS, Quivy AA. New method for studying semiconducting surfaces in air by scanning tunneling microscopy. Modern Physics Letters B. 1997 ; 10( 24): 1189-1195.[citado 2024 ago. 03 ]Vancouver
Ferlauto AS, Quivy AA. New method for studying semiconducting surfaces in air by scanning tunneling microscopy. Modern Physics Letters B. 1997 ; 10( 24): 1189-1195.[citado 2024 ago. 03 ]