Source: Journal of Applied Physics. Unidade: IF
Subjects: ESTRUTURA ELETRÔNICA, DIFRAÇÃO POR RAIOS X
ABNT
HANAMOTO, L K et al. Influence of the interface layers on the transport properties of InP/InGaAs quantum barrier structures grow low pressure metalorganic vapor phase epitaxy. Journal of Applied Physics, v. 93, n. 9, p. 5460-5464, 2003Tradução . . Disponível em: https://doi.org/10.1063/1.1566477. Acesso em: 28 out. 2024.APA
Hanamoto, L. K., Farias, C. M. A., Henriques, A. B., Tribuzy, C. V. B., Saouza, P. L., & Yavich, B. (2003). Influence of the interface layers on the transport properties of InP/InGaAs quantum barrier structures grow low pressure metalorganic vapor phase epitaxy. Journal of Applied Physics, 93( 9), 5460-5464. doi:10.1063/1.1566477NLM
Hanamoto LK, Farias CMA, Henriques AB, Tribuzy CVB, Saouza PL, Yavich B. Influence of the interface layers on the transport properties of InP/InGaAs quantum barrier structures grow low pressure metalorganic vapor phase epitaxy [Internet]. Journal of Applied Physics. 2003 ; 93( 9): 5460-5464.[citado 2024 out. 28 ] Available from: https://doi.org/10.1063/1.1566477Vancouver
Hanamoto LK, Farias CMA, Henriques AB, Tribuzy CVB, Saouza PL, Yavich B. Influence of the interface layers on the transport properties of InP/InGaAs quantum barrier structures grow low pressure metalorganic vapor phase epitaxy [Internet]. Journal of Applied Physics. 2003 ; 93( 9): 5460-5464.[citado 2024 out. 28 ] Available from: https://doi.org/10.1063/1.1566477