Filtros : "Schoenmaker, J" Removido: "MICROSCOPIA ELETRÔNICA DE VARREDURA" Limpar


  • Source: Journal of Magnetism and Magnetic Materials. Unidade: IF

    Subjects: FILMES FINOS, MAGNETISMO

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    • ABNT

      SCHOENMAKER, J e OPPENHEIM, Ivette Frida Cymbaum e CHINAGLIA, Eliane F. Magnetic and structural characterization of CoCrPt and CoCr thin films deposited by magnetron sputtering. Journal of Magnetism and Magnetic Materials, v. 226, p. 1653-1655, 2001Tradução . . Disponível em: https://doi.org/10.1016/s0304-8853(01)00097-x. Acesso em: 18 set. 2024.
    • APA

      Schoenmaker, J., Oppenheim, I. F. C., & Chinaglia, E. F. (2001). Magnetic and structural characterization of CoCrPt and CoCr thin films deposited by magnetron sputtering. Journal of Magnetism and Magnetic Materials, 226, 1653-1655. doi:10.1016/s0304-8853(01)00097-x
    • NLM

      Schoenmaker J, Oppenheim IFC, Chinaglia EF. Magnetic and structural characterization of CoCrPt and CoCr thin films deposited by magnetron sputtering [Internet]. Journal of Magnetism and Magnetic Materials. 2001 ; 226 1653-1655.[citado 2024 set. 18 ] Available from: https://doi.org/10.1016/s0304-8853(01)00097-x
    • Vancouver

      Schoenmaker J, Oppenheim IFC, Chinaglia EF. Magnetic and structural characterization of CoCrPt and CoCr thin films deposited by magnetron sputtering [Internet]. Journal of Magnetism and Magnetic Materials. 2001 ; 226 1653-1655.[citado 2024 set. 18 ] Available from: https://doi.org/10.1016/s0304-8853(01)00097-x

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