Beam test of n-type Silicon pad array detector at PS CERN (2024)
Source: Journal of Instrumentation. Unidade: IF
Subjects: FÍSICA DE PARTÍCULAS, DETETORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SAWAN, e BREGANT, Marco. Beam test of n-type Silicon pad array detector at PS CERN. Journal of Instrumentation, 2024Tradução . . Disponível em: https://doi.org/10.1088/1748-0221/19/09/P09016. Acesso em: 07 out. 2025.APA
Sawan,, & Bregant, M. (2024). Beam test of n-type Silicon pad array detector at PS CERN. Journal of Instrumentation. doi:10.1088/1748-0221/19/09/P09016NLM
Sawan, Bregant M. Beam test of n-type Silicon pad array detector at PS CERN [Internet]. Journal of Instrumentation. 2024 ;[citado 2025 out. 07 ] Available from: https://doi.org/10.1088/1748-0221/19/09/P09016Vancouver
Sawan, Bregant M. Beam test of n-type Silicon pad array detector at PS CERN [Internet]. Journal of Instrumentation. 2024 ;[citado 2025 out. 07 ] Available from: https://doi.org/10.1088/1748-0221/19/09/P09016
