Source: Abstracts. Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil. Unidade: IF
Assunto: RADIAÇÃO IONIZANTE
ABNT
AGUIAR, Vitor Ângelo Paulino de et al. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. 2019, Anais.. São Paulo: Sociedade Brasileira de Física, 2019. . Acesso em: 27 ago. 2024.APA
Aguiar, V. Â. P. de, Medina, N. H., Added, N., Macchione, E. L. A., Alberton, S. G. P. N., Scarduelli, V. B., et al. (2019). Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. In Abstracts. São Paulo: Sociedade Brasileira de Física.NLM
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Scarduelli VB, Allegro PRP, Escudeiro R, Santos HC dos, Silva TF da, Rodrigues CL, Leite AR, Santos OCB dos. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. Abstracts. 2019 ;[citado 2024 ago. 27 ]Vancouver
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Scarduelli VB, Allegro PRP, Escudeiro R, Santos HC dos, Silva TF da, Rodrigues CL, Leite AR, Santos OCB dos. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. Abstracts. 2019 ;[citado 2024 ago. 27 ]