Filtros : "Salay, L C" Limpar

Filtros



Refine with date range


  • Source: Journal of Physical Chemistry. Unidade: IQ

    Assunto: BIOQUÍMICA

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      SALAY, L C e CARMONA-RIBEIRO, Ana Maria. synthetic bilayer wetting on 'Si''O IND.2' surfaces. Journal of Physical Chemistry, v. 102, p. 4011-5, 1998Tradução . . Acesso em: 21 out. 2024.
    • APA

      Salay, L. C., & Carmona-Ribeiro, A. M. (1998). synthetic bilayer wetting on 'Si''O IND.2' surfaces. Journal of Physical Chemistry, 102, 4011-5.
    • NLM

      Salay LC, Carmona-Ribeiro AM. synthetic bilayer wetting on 'Si''O IND.2' surfaces. Journal of Physical Chemistry. 1998 ; 102 4011-5.[citado 2024 out. 21 ]
    • Vancouver

      Salay LC, Carmona-Ribeiro AM. synthetic bilayer wetting on 'Si''O IND.2' surfaces. Journal of Physical Chemistry. 1998 ; 102 4011-5.[citado 2024 out. 21 ]
  • Conference titles: Reunião Anual da Sociedade Brasileira de Bioquímica e Biologia Molecular. Unidade: IQ

    Assunto: BIOQUÍMICA

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      SALAY, L C e CARMONA-RIBEIRO, Ana Maria. Determination of contact angle as a tool to study adsorption of bilayer model membranes on silicon dioxide planar surfaces. 1997, Anais.. São Paulo: SBBQ, 1997. . Acesso em: 21 out. 2024.
    • APA

      Salay, L. C., & Carmona-Ribeiro, A. M. (1997). Determination of contact angle as a tool to study adsorption of bilayer model membranes on silicon dioxide planar surfaces. In . São Paulo: SBBQ.
    • NLM

      Salay LC, Carmona-Ribeiro AM. Determination of contact angle as a tool to study adsorption of bilayer model membranes on silicon dioxide planar surfaces. 1997 ;[citado 2024 out. 21 ]
    • Vancouver

      Salay LC, Carmona-Ribeiro AM. Determination of contact angle as a tool to study adsorption of bilayer model membranes on silicon dioxide planar surfaces. 1997 ;[citado 2024 out. 21 ]
  • Source: Journal of the Electrochemical Society. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      SANTOS FILHO, Sebastião Gomes dos et al. A Less critical cleaning procedure for silicon wafers using diluted hf dip and boiling in isopropil alcohol as final steps. Journal of the Electrochemical Society, v. 142, n. 3 , p. 902-7, 1995Tradução . . Disponível em: https://doi.org/10.1149/1.2048555. Acesso em: 21 out. 2024.
    • APA

      Santos Filho, S. G. dos, Hasenack, C. M., Salay, L. C., & Mertens, P. W. (1995). A Less critical cleaning procedure for silicon wafers using diluted hf dip and boiling in isopropil alcohol as final steps. Journal of the Electrochemical Society, 142( 3 ), 902-7. doi:10.1149/1.2048555
    • NLM

      Santos Filho SG dos, Hasenack CM, Salay LC, Mertens PW. A Less critical cleaning procedure for silicon wafers using diluted hf dip and boiling in isopropil alcohol as final steps [Internet]. Journal of the Electrochemical Society. 1995 ;142( 3 ): 902-7.[citado 2024 out. 21 ] Available from: https://doi.org/10.1149/1.2048555
    • Vancouver

      Santos Filho SG dos, Hasenack CM, Salay LC, Mertens PW. A Less critical cleaning procedure for silicon wafers using diluted hf dip and boiling in isopropil alcohol as final steps [Internet]. Journal of the Electrochemical Society. 1995 ;142( 3 ): 902-7.[citado 2024 out. 21 ] Available from: https://doi.org/10.1149/1.2048555

Digital Library of Intellectual Production of Universidade de São Paulo     2012 - 2024