Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs (2013)
Martino, João Antonio 
; Santos, Sara Dereste dos; Simoen, Eddy ; Strobe, V.; Cretu, B.; Routoure, J.-M.; Carin, R.; Aoulaiche, Marc; Veloso, Anabela; Claeys, Cor
Source: EUROSOI 2013. Conference titles: European Workshop on Silicon on Insulator Technology, Devices and Circuits. Unidade: EP
Assunto: MICROELETRÔNICA (CONGRESSOS)
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MARTINO, João Antonio et al. Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs. 2013, Anais.. Paris: Institut Superieur d'Électronique, 2013. . Acesso em: 01 nov. 2024.APA
Martino, J. A., Santos, S. D. dos, Simoen, E., Strobe, V., Cretu, B., Routoure, J. -M., et al. (2013). Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs. In EUROSOI 2013. Paris: Institut Superieur d'Électronique.NLM
Martino JA, Santos SD dos, Simoen E, Strobe V, Cretu B, Routoure J-M, Carin R, Aoulaiche M, Veloso A, Claeys C. Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs. EUROSOI 2013. 2013 ;[citado 2024 nov. 01 ]Vancouver
Martino JA, Santos SD dos, Simoen E, Strobe V, Cretu B, Routoure J-M, Carin R, Aoulaiche M, Veloso A, Claeys C. Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs. EUROSOI 2013. 2013 ;[citado 2024 nov. 01 ]
