Optical characterization of GaAs/AlAs multiple quantum wells interfaces (1998)
Lemos, V; Sérgio, C. S.; Pimenta Lima, A; Quivy, Alain André 
; Enderlein, R; Leite, J. R.; Carvalho Junior, W
Source: Radiation Effects & Defects in Solids. Conference titles: Symposium on Defect Dependent Processes in Insulators and Seminconductors. Unidade: IF
Subjects: FÍSICA, FÍSICA NUCLEAR
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LEMOS, V et al. Optical characterization of GaAs/AlAs multiple quantum wells interfaces. Radiation Effects & Defects in Solids. London: Gordon & Breach. . Acesso em: 04 maio 2026. , 1998APA
Lemos, V., Sérgio, C. S., Pimenta Lima, A., Quivy, A. A., Enderlein, R., Leite, J. R., & Carvalho Junior, W. (1998). Optical characterization of GaAs/AlAs multiple quantum wells interfaces. Radiation Effects & Defects in Solids. London: Gordon & Breach.NLM
Lemos V, Sérgio CS, Pimenta Lima A, Quivy AA, Enderlein R, Leite JR, Carvalho Junior W. Optical characterization of GaAs/AlAs multiple quantum wells interfaces. Radiation Effects & Defects in Solids. 1998 ; 146 187-197.[citado 2026 maio 04 ]Vancouver
Lemos V, Sérgio CS, Pimenta Lima A, Quivy AA, Enderlein R, Leite JR, Carvalho Junior W. Optical characterization of GaAs/AlAs multiple quantum wells interfaces. Radiation Effects & Defects in Solids. 1998 ; 146 187-197.[citado 2026 maio 04 ]
