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Filtros : "Morelhão, Sérgio L." Limpar

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  • Artigo de periodico

    Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique (2020)

    Hönnicke, Marcelo G.; Morelhão, Sérgio L.

    Source: Radiation Physics and Chemistry. Unidade: IF

    Subjects: CRISTALOGRAFIA DE RAIOS X, RADIAÇÃO SINCROTRON, MATERIAIS NANOESTRUTURADOS, NANOPARTÍCULAS

    Versão PublicadaAcesso à fonteDOIHow to cite
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    • ABNT

      HÖNNICKE, Marcelo G. e MORELHÃO, Sérgio L. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique. Radiation Physics and Chemistry, v. 167, 2020Tradução . . Disponível em: https://doi.org/10.1016/j.radphyschem.2019.04.023. Acesso em: 12 nov. 2024.

    • APA

      Hönnicke, M. G., & Morelhão, S. L. (2020). Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique. Radiation Physics and Chemistry, 167. doi:10.1016/j.radphyschem.2019.04.023

    • NLM

      Hönnicke MG, Morelhão SL. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique [Internet]. Radiation Physics and Chemistry. 2020 ; 167[citado 2024 nov. 12 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.023

    • Vancouver

      Hönnicke MG, Morelhão SL. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique [Internet]. Radiation Physics and Chemistry. 2020 ; 167[citado 2024 nov. 12 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.023

  • Artigo de periodico

    Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators (2019)

    Morelhão, Sérgio L. ; Kycia, Stefan W.; Netzke, Samuel; Fornari, Celso I.; Rappl, Paulo H. O.; Abramof, Eduardo

    Source: The Journal of Physical Chemistry C. Unidade: IF

    Subjects: RADIAÇÃO SINCROTRON, SEMICONDUTORES (FÍSICO-QUÍMICA), MATERIAIS NANOESTRUTURADOS, EPITAXIA POR FEIXE MOLECULAR, CRISTALOGRAFIA, BISMUTO

    Versão PublicadaAcesso à fonteAcesso à fonteDOIHow to cite
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    • ABNT

      MORELHÃO, Sérgio L. et al. Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators. The Journal of Physical Chemistry C, v. 123, n. 40, p. 24818-24825, 2019Tradução . . Disponível em: https://doi-org.ez67.periodicos.capes.gov.br/10.1021/acs.jpcc.9b05377. Acesso em: 12 nov. 2024.

    • APA

      Morelhão, S. L., Kycia, S. W., Netzke, S., Fornari, C. I., Rappl, P. H. O., & Abramof, E. (2019). Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators. The Journal of Physical Chemistry C, 123( 40), 24818-24825. doi:10.1021/acs.jpcc.9b05377

    • NLM

      Morelhão SL, Kycia SW, Netzke S, Fornari CI, Rappl PHO, Abramof E. Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators [Internet]. The Journal of Physical Chemistry C. 2019 ; 123( 40): 24818-24825.[citado 2024 nov. 12 ] Available from: https://doi-org.ez67.periodicos.capes.gov.br/10.1021/acs.jpcc.9b05377

    • Vancouver

      Morelhão SL, Kycia SW, Netzke S, Fornari CI, Rappl PHO, Abramof E. Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators [Internet]. The Journal of Physical Chemistry C. 2019 ; 123( 40): 24818-24825.[citado 2024 nov. 12 ] Available from: https://doi-org.ez67.periodicos.capes.gov.br/10.1021/acs.jpcc.9b05377

  • Artigo de periodico

    Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning (2014)

    Amirkhanyan, Zohrab G.; Remédios, Claúdio M. R.; Mascarenhas, Yvonne Primerano ; Morelhão, Sérgio L.

    Source: Journal of Applied Crystallography. Unidade: IFSC

    Subjects: CRISTALOGRAFIA, RAIOS X

    Acesso à fonteDOIHow to cite
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    • ABNT

      AMIRKHANYAN, Zohrab G. et al. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning. Journal of Applied Crystallography, v. 47, p. 160-165, 2014Tradução . . Disponível em: https://doi.org/10.1107/S1600576713028677. Acesso em: 12 nov. 2024.

    • APA

      Amirkhanyan, Z. G., Remédios, C. M. R., Mascarenhas, Y. P., & Morelhão, S. L. (2014). Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning. Journal of Applied Crystallography, 47, 160-165. doi:10.1107/S1600576713028677

    • NLM

      Amirkhanyan ZG, Remédios CMR, Mascarenhas YP, Morelhão SL. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning [Internet]. Journal of Applied Crystallography. 2014 ; 47 160-165.[citado 2024 nov. 12 ] Available from: https://doi.org/10.1107/S1600576713028677

    • Vancouver

      Amirkhanyan ZG, Remédios CMR, Mascarenhas YP, Morelhão SL. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning [Internet]. Journal of Applied Crystallography. 2014 ; 47 160-165.[citado 2024 nov. 12 ] Available from: https://doi.org/10.1107/S1600576713028677
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