Nonlinear ellipse rotation measurements in optical thick samples (2015)
Source: Applied Physics B. Unidade: IFSC
Subjects: FOTÔNICA, VIDRO, LASER
ABNT
MIGUEZ, M. L. et al. Nonlinear ellipse rotation measurements in optical thick samples. Applied Physics B, v. 120, n. 4, p. 653-658, 2015Tradução . . Disponível em: https://doi.org/10.1007/s00340-015-6178-x. Acesso em: 11 out. 2024.APA
Miguez, M. L., Barbano, E. C., Coura, J. A., Zílio, S. C., & Misoguti, L. (2015). Nonlinear ellipse rotation measurements in optical thick samples. Applied Physics B, 120( 4), 653-658. doi:10.1007/s00340-015-6178-xNLM
Miguez ML, Barbano EC, Coura JA, Zílio SC, Misoguti L. Nonlinear ellipse rotation measurements in optical thick samples [Internet]. Applied Physics B. 2015 ; 120( 4): 653-658.[citado 2024 out. 11 ] Available from: https://doi.org/10.1007/s00340-015-6178-xVancouver
Miguez ML, Barbano EC, Coura JA, Zílio SC, Misoguti L. Nonlinear ellipse rotation measurements in optical thick samples [Internet]. Applied Physics B. 2015 ; 120( 4): 653-658.[citado 2024 out. 11 ] Available from: https://doi.org/10.1007/s00340-015-6178-x