Nonlinear ellipse rotation measurements in optical thick samples (2015)
- Authors:
- USP affiliated authors: ZILIO, SÉRGIO CARLOS - IFSC ; MISOGUTI, LINO - IFSC
- Unidade: IFSC
- DOI: 10.1007/s00340-015-6178-x
- Subjects: FOTÔNICA; VIDRO; LASER
- Language: Inglês
- Imprenta:
- Publisher place: Heidelberg
- Date published: 2015
- Source:
- Título: Applied Physics B
- ISSN: 0946-2171
- Volume/Número/Paginação/Ano: v. 120, n. 4, p. 653-658, Sept. 2015
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
MIGUEZ, M. L. et al. Nonlinear ellipse rotation measurements in optical thick samples. Applied Physics B, v. 120, n. 4, p. 653-658, 2015Tradução . . Disponível em: https://doi.org/10.1007/s00340-015-6178-x. Acesso em: 22 jan. 2026. -
APA
Miguez, M. L., Barbano, E. C., Coura, J. A., Zílio, S. C., & Misoguti, L. (2015). Nonlinear ellipse rotation measurements in optical thick samples. Applied Physics B, 120( 4), 653-658. doi:10.1007/s00340-015-6178-x -
NLM
Miguez ML, Barbano EC, Coura JA, Zílio SC, Misoguti L. Nonlinear ellipse rotation measurements in optical thick samples [Internet]. Applied Physics B. 2015 ; 120( 4): 653-658.[citado 2026 jan. 22 ] Available from: https://doi.org/10.1007/s00340-015-6178-x -
Vancouver
Miguez ML, Barbano EC, Coura JA, Zílio SC, Misoguti L. Nonlinear ellipse rotation measurements in optical thick samples [Internet]. Applied Physics B. 2015 ; 120( 4): 653-658.[citado 2026 jan. 22 ] Available from: https://doi.org/10.1007/s00340-015-6178-x - Accurate measurement of nonlinear ellipse rotation using a phase-sensitive method
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Informações sobre o DOI: 10.1007/s00340-015-6178-x (Fonte: oaDOI API)
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