Atomic-scale characterization of interfaces in the 'GA''AS' / 'AL''GA''AS' superlattices (1995)
Source: Materials Science and Engineering B. Unidade: IFSC
Subjects: MATÉRIA CONDENSADA, MATÉRIA CONDENSADA (PROPRIEDADES ELÉTRICAS), MATÉRIA CONDENSADA
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PUSEP, Yuri A et al. Atomic-scale characterization of interfaces in the 'GA''AS' / 'AL''GA''AS' superlattices. Materials Science and Engineering B, v. 35, p. 180-3, 1995Tradução . . Acesso em: 10 nov. 2024.APA
Pusep, Y. A., Silva, S. W., Galzerani, J. C., Lubyshev, D. I., Basmaji, P., Milekhin, A. G., et al. (1995). Atomic-scale characterization of interfaces in the 'GA''AS' / 'AL''GA''AS' superlattices. Materials Science and Engineering B, 35, 180-3.NLM
Pusep YA, Silva SW, Galzerani JC, Lubyshev DI, Basmaji P, Milekhin AG, Preobrazhenskii VV, Semyagin BR, Marahovka II. Atomic-scale characterization of interfaces in the 'GA''AS' / 'AL''GA''AS' superlattices. Materials Science and Engineering B. 1995 ;35 180-3.[citado 2024 nov. 10 ]Vancouver
Pusep YA, Silva SW, Galzerani JC, Lubyshev DI, Basmaji P, Milekhin AG, Preobrazhenskii VV, Semyagin BR, Marahovka II. Atomic-scale characterization of interfaces in the 'GA''AS' / 'AL''GA''AS' superlattices. Materials Science and Engineering B. 1995 ;35 180-3.[citado 2024 nov. 10 ]