Z-scan measurements with Fourier analysis in ion-doped solids (1997)
Source: Applied Physics Letters. Unidade: IFSC
Subjects: MATÉRIA CONDENSADA, MATÉRIA CONDENSADA
ABNT
MENDONÇA, Cleber Renato e MISOGUTI, Lino e ZÍLIO, Sérgio Carlos. Z-scan measurements with Fourier analysis in ion-doped solids. Applied Physics Letters, v. 71, n. 5, p. 2094-2096, 1997Tradução . . Disponível em: https://doi.org/10.1063/1.119352. Acesso em: 03 nov. 2024.APA
Mendonça, C. R., Misoguti, L., & Zílio, S. C. (1997). Z-scan measurements with Fourier analysis in ion-doped solids. Applied Physics Letters, 71( 5), 2094-2096. doi:10.1063/1.119352NLM
Mendonça CR, Misoguti L, Zílio SC. Z-scan measurements with Fourier analysis in ion-doped solids [Internet]. Applied Physics Letters. 1997 ; 71( 5): 2094-2096.[citado 2024 nov. 03 ] Available from: https://doi.org/10.1063/1.119352Vancouver
Mendonça CR, Misoguti L, Zílio SC. Z-scan measurements with Fourier analysis in ion-doped solids [Internet]. Applied Physics Letters. 1997 ; 71( 5): 2094-2096.[citado 2024 nov. 03 ] Available from: https://doi.org/10.1063/1.119352