Micro-Raman and electron microscopy analysis of cubic GaN layers on (001) GaAs (1998)
Source: Materials Science Forum. Conference titles: Silicon Carbide III-Nitrides and Related Materials International Conference. Unidade: IF
Assunto: SEMICONDUTORES
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TABATA, A et al. Micro-Raman and electron microscopy analysis of cubic GaN layers on (001) GaAs. Materials Science Forum. Zuerich: Trans Tech Publications. . Acesso em: 25 set. 2024. , 1998APA
Tabata, A., Enderlein, R., Lima, A. P., Leite, J. R., Lemos, V., Kaiser, S., et al. (1998). Micro-Raman and electron microscopy analysis of cubic GaN layers on (001) GaAs. Materials Science Forum. Zuerich: Trans Tech Publications.NLM
Tabata A, Enderlein R, Lima AP, Leite JR, Lemos V, Kaiser S, Schikora D, Schoettker B, Koehler U, Lischka K. Micro-Raman and electron microscopy analysis of cubic GaN layers on (001) GaAs. Materials Science Forum. 1998 ; 264-268 1367-1370.[citado 2024 set. 25 ]Vancouver
Tabata A, Enderlein R, Lima AP, Leite JR, Lemos V, Kaiser S, Schikora D, Schoettker B, Koehler U, Lischka K. Micro-Raman and electron microscopy analysis of cubic GaN layers on (001) GaAs. Materials Science Forum. 1998 ; 264-268 1367-1370.[citado 2024 set. 25 ]