Photoreflectance investigations of semiconductor device structutres (1995)
Source: Materials Science and Engeneering B. Conference titles: International Conference on Low Dimensional Structures and Devices. Unidade: IF
Assunto: MATÉRIA CONDENSADA
ABNT
SOARES, J A N T et al. Photoreflectance investigations of semiconductor device structutres. Materials Science and Engeneering B. Cingapura: Instituto de Física, Universidade de São Paulo. . Acesso em: 26 ago. 2024. , 1995APA
Soares, J. A. N. T., Beliaev, D., Enderlein, R., Scolfaro, L. M. R., & Leite, J. R. (1995). Photoreflectance investigations of semiconductor device structutres. Materials Science and Engeneering B. Cingapura: Instituto de Física, Universidade de São Paulo.NLM
Soares JANT, Beliaev D, Enderlein R, Scolfaro LMR, Leite JR. Photoreflectance investigations of semiconductor device structutres. Materials Science and Engeneering B. 1995 ;35 267-72.[citado 2024 ago. 26 ]Vancouver
Soares JANT, Beliaev D, Enderlein R, Scolfaro LMR, Leite JR. Photoreflectance investigations of semiconductor device structutres. Materials Science and Engeneering B. 1995 ;35 267-72.[citado 2024 ago. 26 ]