Martins, Thiago de Castro 
; Tsuzuki, Marcos de Sales Guerra
Source: Proceedings. Conference titles: World Congress of the International Federation of Automatic Control (IFAC). Unidade: EP
Subjects: PROBLEMAS INVERSOS, RECONSTRUÇÃO DE SINAIS, TOMOGRAFIA, MÉTODO DOS ELEMENTOS FINITOS
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MARTINS, Thiago de Castro e TSUZUKI, Marcos de Sales Guerra. Simulated annealing with partial evaluation of objective function applied to electrical impedance tomography. 2011, Anais.. Laxenburg, Austria: IFAC, 2011. Disponível em: https://doi.org/10.3182/20110828-6-IT-1002.01452. Acesso em: 31 out. 2024.APA
Martins, T. de C., & Tsuzuki, M. de S. G. (2011). Simulated annealing with partial evaluation of objective function applied to electrical impedance tomography. In Proceedings. Laxenburg, Austria: IFAC. doi:10.3182/20110828-6-IT-1002.01452NLM
Martins T de C, Tsuzuki M de SG. Simulated annealing with partial evaluation of objective function applied to electrical impedance tomography [Internet]. Proceedings. 2011 ;[citado 2024 out. 31 ] Available from: https://doi.org/10.3182/20110828-6-IT-1002.01452Vancouver
Martins T de C, Tsuzuki M de SG. Simulated annealing with partial evaluation of objective function applied to electrical impedance tomography [Internet]. Proceedings. 2011 ;[citado 2024 out. 31 ] Available from: https://doi.org/10.3182/20110828-6-IT-1002.01452
