Simulated annealing with partial evaluation of objective function applied to electrical impedance tomography (2011)
- Authors:
- USP affiliated authors: MARTINS, THIAGO DE CASTRO - EP ; TSUZUKI, MARCOS DE SALES GUERRA - EP
- Unidade: EP
- DOI: 10.3182/20110828-6-IT-1002.01452
- Subjects: PROBLEMAS INVERSOS; RECONSTRUÇÃO DE SINAIS; TOMOGRAFIA; MÉTODO DOS ELEMENTOS FINITOS
- Language: Inglês
- Imprenta:
- Publisher: IFAC
- Publisher place: Laxenburg, Austria
- Date published: 2011
- ISBN: 9783902661937
- Source:
- Título: Proceedings
- Conference titles: World Congress of the International Federation of Automatic Control (IFAC)
- Este periódico é de assinatura
- Este artigo é de acesso aberto
- URL de acesso aberto
- Cor do Acesso Aberto: bronze
-
ABNT
MARTINS, Thiago de Castro e TSUZUKI, Marcos de Sales Guerra. Simulated annealing with partial evaluation of objective function applied to electrical impedance tomography. 2011, Anais.. Laxenburg, Austria: IFAC, 2011. Disponível em: https://doi.org/10.3182/20110828-6-IT-1002.01452. Acesso em: 17 out. 2024. -
APA
Martins, T. de C., & Tsuzuki, M. de S. G. (2011). Simulated annealing with partial evaluation of objective function applied to electrical impedance tomography. In Proceedings. Laxenburg, Austria: IFAC. doi:10.3182/20110828-6-IT-1002.01452 -
NLM
Martins T de C, Tsuzuki M de SG. Simulated annealing with partial evaluation of objective function applied to electrical impedance tomography [Internet]. Proceedings. 2011 ;[citado 2024 out. 17 ] Available from: https://doi.org/10.3182/20110828-6-IT-1002.01452 -
Vancouver
Martins T de C, Tsuzuki M de SG. Simulated annealing with partial evaluation of objective function applied to electrical impedance tomography [Internet]. Proceedings. 2011 ;[citado 2024 out. 17 ] Available from: https://doi.org/10.3182/20110828-6-IT-1002.01452 - 3 D reconstruction using low precision scanner
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Informações sobre o DOI: 10.3182/20110828-6-IT-1002.01452 (Fonte: oaDOI API)
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