Source: Journal of Raman Spectroscopy. Unidade: IFSC
Subjects: ESPECTROSCOPIA RAMAN, NANOPARTÍCULAS, PRATA
ABNT
QUEIROZ, Alfredo Antonio Alencar Exposito De e ANDRADE, Marcelo Barbosa de e QUEIROZ, Alvaro Antonio Alencar de. Thermal degradation threshold in Ag@Chondroitin sulfate memristors revealed by temperature-resolved Raman spectroscopy. Journal of Raman Spectroscopy, v. 57, n. Ja 2026, p. 169-180 + supporting information, 2026Tradução . . Disponível em: https://doi.org/10.1002/jrs.70039. Acesso em: 20 jan. 2026.APA
Queiroz, A. A. A. E. D., Andrade, M. B. de, & Queiroz, A. A. A. de. (2026). Thermal degradation threshold in Ag@Chondroitin sulfate memristors revealed by temperature-resolved Raman spectroscopy. Journal of Raman Spectroscopy, 57( Ja 2026), 169-180 + supporting information. doi:10.1002/jrs.70039NLM
Queiroz AAAED, Andrade MB de, Queiroz AAA de. Thermal degradation threshold in Ag@Chondroitin sulfate memristors revealed by temperature-resolved Raman spectroscopy [Internet]. Journal of Raman Spectroscopy. 2026 ; 57( Ja 2026): 169-180 + supporting information.[citado 2026 jan. 20 ] Available from: https://doi.org/10.1002/jrs.70039Vancouver
Queiroz AAAED, Andrade MB de, Queiroz AAA de. Thermal degradation threshold in Ag@Chondroitin sulfate memristors revealed by temperature-resolved Raman spectroscopy [Internet]. Journal of Raman Spectroscopy. 2026 ; 57( Ja 2026): 169-180 + supporting information.[citado 2026 jan. 20 ] Available from: https://doi.org/10.1002/jrs.70039
