Benites, Luis A. C.; Benevenuti, Fabio 
; Oliveira, Adria B de ; Kastensmidt, Fernanda L ; Added, Nemitala ; Aguiar, Vitor Ângelo Paulino de ; Nilberto H. Medina, Nilberto Heder ; Guazzelli, Marcilei A
Source: IEEE Transactions on Nuclear Science. Unidades: IF, IB
Subjects: FÍSICA NUCLEAR, ÍONS PESADOS
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ABNT
BENITES, Luis A. C. et al. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, v. 66 , n. 7, p. 1433-1440, 2019Tradução . . Disponível em: https://doi.org/10.1109/TNS.2019.2921796. Acesso em: 18 nov. 2024.APA
Benites, L. A. C., Benevenuti, F., Oliveira, A. B. de, Kastensmidt, F. L., Added, N., Aguiar, V. Â. P. de, et al. (2019). Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, 66 ( 7), 1433-1440. doi:10.1109/TNS.2019.2921796NLM
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.[citado 2024 nov. 18 ] Available from: https://doi.org/10.1109/TNS.2019.2921796Vancouver
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.[citado 2024 nov. 18 ] Available from: https://doi.org/10.1109/TNS.2019.2921796
