Bias and synergy in the self-consistent approach of data analysis of ion beam techniques (2021)
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SILVA, T. F. et al. Bias and synergy in the self-consistent approach of data analysis of ion beam techniques. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/2111.13298.pdf. Acesso em: 18 nov. 2024. , 2021APA
Silva, T. F., Toussaint, U. von, Mayer, M., Rodrigues, C. L., & Tabacniks, M. H. (2021). Bias and synergy in the self-consistent approach of data analysis of ion beam techniques. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/2111.13298.pdfNLM
Silva TF, Toussaint U von, Mayer M, Rodrigues CL, Tabacniks MH. Bias and synergy in the self-consistent approach of data analysis of ion beam techniques [Internet]. 2021 ;[citado 2024 nov. 18 ] Available from: https://arxiv.org/pdf/2111.13298.pdfVancouver
Silva TF, Toussaint U von, Mayer M, Rodrigues CL, Tabacniks MH. Bias and synergy in the self-consistent approach of data analysis of ion beam techniques [Internet]. 2021 ;[citado 2024 nov. 18 ] Available from: https://arxiv.org/pdf/2111.13298.pdf