Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications (2005)
Fonte: Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum. Unidade: IF
Assuntos: ESPECTROSCOPIA DE RAIO X, RADIAÇÃO IONIZANTE, DOSAGEM DE RADIAÇÃO, SEMICONDUTORES
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FREITAS, Marcelo B e MEDEIROS, F H M e YOSHIMURA, Elisabeth Mateus. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum, v. 480-481, p. 53-58, 2005Tradução . . Disponível em: https://repositorio.usp.br/directbitstream/7e67de98-9b5a-43e1-9059-b268565bad79/Freitas_and_Yoshimura_MSF_2005.pdf. Acesso em: 12 nov. 2024.APA
Freitas, M. B., Medeiros, F. H. M., & Yoshimura, E. M. (2005). Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum, 480-481, 53-58. Recuperado de https://repositorio.usp.br/directbitstream/7e67de98-9b5a-43e1-9059-b268565bad79/Freitas_and_Yoshimura_MSF_2005.pdfNLM
Freitas MB, Medeiros FHM, Yoshimura EM. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications [Internet]. Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum. 2005 ; 480-481 53-58.[citado 2024 nov. 12 ] Available from: https://repositorio.usp.br/directbitstream/7e67de98-9b5a-43e1-9059-b268565bad79/Freitas_and_Yoshimura_MSF_2005.pdfVancouver
Freitas MB, Medeiros FHM, Yoshimura EM. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications [Internet]. Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum. 2005 ; 480-481 53-58.[citado 2024 nov. 12 ] Available from: https://repositorio.usp.br/directbitstream/7e67de98-9b5a-43e1-9059-b268565bad79/Freitas_and_Yoshimura_MSF_2005.pdf
