Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications (2005)
- Authors:
- Autor USP: YOSHIMURA, ELISABETH MATEUS - IF
- Unidade: IF
- Subjects: ESPECTROSCOPIA DE RAIO X; RADIAÇÃO IONIZANTE; DOSAGEM DE RADIAÇÃO; SEMICONDUTORES
- Language: Inglês
- Imprenta:
- Publisher: Trans Tech Publications Ltda
- Publisher place: Zurich
- Date published: 2005
- Source:
- Título do periódico: Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum
- ISSN: 0255-5476
- Volume/Número/Paginação/Ano: v. 480-481, p. 53-58, 2005
-
ABNT
FREITAS, Marcelo B; MEDEIROS, F H M; YOSHIMURA, Elisabeth Mateus. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum, Zurich, Trans Tech Publications Ltda, v. 480-481, p. 53-58, 2005. -
APA
Freitas, M. B., Medeiros, F. H. M., & Yoshimura, E. M. (2005). Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum, 480-481, 53-58. -
NLM
Freitas MB, Medeiros FHM, Yoshimura EM. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum. 2005 ; 480-481 53-58. -
Vancouver
Freitas MB, Medeiros FHM, Yoshimura EM. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Cross-Disciplinary Applied Research in Materials Science and Technololy Materials Science Forum. 2005 ; 480-481 53-58. - Determinacao da dose devida a presenca de radonio em ambientes fechados
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