Source: Proceedings. Conference titles: International Conference on Metamaterials, Photonic Crystals and Plasmonics - META 2019. Unidade: EESC
Subjects: ÓPTICA, LENTES, SENSORES ÓPTICOS, INFRAVERMELHO
ABNT
MARTINS, Augusto et al. Incidence angle-dependence in image reconstruction crosstalk of broadband birefringent c-Si metasurfaces. 2019, Anais.. Lisbon: Escola de Engenharia de São Carlos, Universidade de São Paulo, 2019. Disponível em: https://repositorio.usp.br/directbitstream/30d18e06-0770-43f1-a6fe-638089e750f0/sysno3192016_trabalho%2002.pdf. Acesso em: 05 nov. 2024.APA
Martins, A., Li, J., Mota, A. F., Wang, Y., Goncalves Neto, L., Borges, B. -H. V., & Martins, E. R. (2019). Incidence angle-dependence in image reconstruction crosstalk of broadband birefringent c-Si metasurfaces. In Proceedings. Lisbon: Escola de Engenharia de São Carlos, Universidade de São Paulo. Recuperado de https://repositorio.usp.br/directbitstream/30d18e06-0770-43f1-a6fe-638089e750f0/sysno3192016_trabalho%2002.pdfNLM
Martins A, Li J, Mota AF, Wang Y, Goncalves Neto L, Borges B-HV, Martins ER. Incidence angle-dependence in image reconstruction crosstalk of broadband birefringent c-Si metasurfaces [Internet]. Proceedings. 2019 ;[citado 2024 nov. 05 ] Available from: https://repositorio.usp.br/directbitstream/30d18e06-0770-43f1-a6fe-638089e750f0/sysno3192016_trabalho%2002.pdfVancouver
Martins A, Li J, Mota AF, Wang Y, Goncalves Neto L, Borges B-HV, Martins ER. Incidence angle-dependence in image reconstruction crosstalk of broadband birefringent c-Si metasurfaces [Internet]. Proceedings. 2019 ;[citado 2024 nov. 05 ] Available from: https://repositorio.usp.br/directbitstream/30d18e06-0770-43f1-a6fe-638089e750f0/sysno3192016_trabalho%2002.pdf