Wood, Thomas; Le Rouzo, Judikaël; Flory, François; Coudray, Paul; Mastelaro, Valmor Roberto 
; Pelissari, Pedro; Zílio, Sérgio Carlos
Source: Proceedings of SPIE. Conference titles: Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors. Unidade: IFSC
Subjects: FILMES FINOS, SEMICONDUTORES, POLÍMEROS (MATERIAIS), DISPERSÃO DA LUZ, BLENDAS
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WOOD, Thomas et al. Comparison of refractive indices measured by m-lines and ellipsometry: application to polymer blend and ceramic thin films for gas sensors. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. Disponível em: https://doi.org/10.1117/12.928693. Acesso em: 03 nov. 2024. , 2012APA
Wood, T., Le Rouzo, J., Flory, F., Coudray, P., Mastelaro, V. R., Pelissari, P., & Zílio, S. C. (2012). Comparison of refractive indices measured by m-lines and ellipsometry: application to polymer blend and ceramic thin films for gas sensors. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. doi:10.1117/12.928693NLM
Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Comparison of refractive indices measured by m-lines and ellipsometry: application to polymer blend and ceramic thin films for gas sensors [Internet]. Proceedings of SPIE. 2012 ; 8466 84660T-1-84660T-10.[citado 2024 nov. 03 ] Available from: https://doi.org/10.1117/12.928693Vancouver
Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Comparison of refractive indices measured by m-lines and ellipsometry: application to polymer blend and ceramic thin films for gas sensors [Internet]. Proceedings of SPIE. 2012 ; 8466 84660T-1-84660T-10.[citado 2024 nov. 03 ] Available from: https://doi.org/10.1117/12.928693
