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Artigo de periodico
Temperature-dependent Raman scattering of the Ge + GeOx system and its potential as an optical thermometer (2020)
Zanatta, Antonio Ricardo
Source: Results in Physics. Unidade: IFSC
Subjects: ESPECTROSCOPIA RAMAN, FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ZANATTA, Antonio Ricardo. Temperature-dependent Raman scattering of the Ge + GeOx system and its potential as an optical thermometer. Results in Physics, v. 19, p. 103500-103500-9, 2020Tradução . . Disponível em: https://doi.org/10.1016/j.rinp.2020.103500. Acesso em: 30 jun. 2024.
APA
Zanatta, A. R. (2020). Temperature-dependent Raman scattering of the Ge + GeOx system and its potential as an optical thermometer. Results in Physics, 19, 103500-103500-9. doi:10.1016/j.rinp.2020.103500
NLM
Zanatta AR. Temperature-dependent Raman scattering of the Ge + GeOx system and its potential as an optical thermometer [Internet]. Results in Physics. 2020 ; 19 103500-103500-9.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1016/j.rinp.2020.103500
Vancouver
Zanatta AR. Temperature-dependent Raman scattering of the Ge + GeOx system and its potential as an optical thermometer [Internet]. Results in Physics. 2020 ; 19 103500-103500-9.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1016/j.rinp.2020.103500
Artigo de periodico
A sensitive temperature probe based on Er3+-doped GeOx films (2020)
Zanatta, Antonio Ricardo
Source: Results in Physics. Unidade: IFSC
Subjects: FILMES FINOS, TERRAS RARAS, LUMINESCÊNCIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ZANATTA, Antonio Ricardo. A sensitive temperature probe based on Er3+-doped GeOx films. Results in Physics, v. 16, p. 102871-1-1102871-4, 2020Tradução . . Disponível em: https://doi.org/10.1016/j.rinp.2019.102871. Acesso em: 30 jun. 2024.
APA
Zanatta, A. R. (2020). A sensitive temperature probe based on Er3+-doped GeOx films. Results in Physics, 16, 102871-1-1102871-4. doi:10.1016/j.rinp.2019.102871
NLM
Zanatta AR. A sensitive temperature probe based on Er3+-doped GeOx films [Internet]. Results in Physics. 2020 ; 16 102871-1-1102871-4.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1016/j.rinp.2019.102871
Vancouver
Zanatta AR. A sensitive temperature probe based on Er3+-doped GeOx films [Internet]. Results in Physics. 2020 ; 16 102871-1-1102871-4.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1016/j.rinp.2019.102871
Artigo de periodico
Role of rare earth elements and entropy on the anatase-to-rutile phase transformation of TiO2 thin films deposited by ion beam sputtering (2020)
Scoca, Diego L. S. ; Cemin, Felipe ; Bilmes, Sara A.; Figueroa, Carlos A. ; Zanatta, Antonio Ricardo ; Alvarez, Fernando
Source: ACS Omega. Unidade: IFSC
Subjects: TERRAS RARAS, FILMES FINOS, LUMINESCÊNCIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SCOCA, Diego L. S. et al. Role of rare earth elements and entropy on the anatase-to-rutile phase transformation of TiO2 thin films deposited by ion beam sputtering. ACS Omega, v. No 2020, n. 43, p. 28027-28036, 2020Tradução . . Disponível em: https://doi.org/10.1021/acsomega.0c03431. Acesso em: 30 jun. 2024.
APA
Scoca, D. L. S., Cemin, F., Bilmes, S. A., Figueroa, C. A., Zanatta, A. R., & Alvarez, F. (2020). Role of rare earth elements and entropy on the anatase-to-rutile phase transformation of TiO2 thin films deposited by ion beam sputtering. ACS Omega, No 2020( 43), 28027-28036. doi:10.1021/acsomega.0c03431
NLM
Scoca DLS, Cemin F, Bilmes SA, Figueroa CA, Zanatta AR, Alvarez F. Role of rare earth elements and entropy on the anatase-to-rutile phase transformation of TiO2 thin films deposited by ion beam sputtering [Internet]. ACS Omega. 2020 ; No 2020( 43): 28027-28036.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1021/acsomega.0c03431
Vancouver
Scoca DLS, Cemin F, Bilmes SA, Figueroa CA, Zanatta AR, Alvarez F. Role of rare earth elements and entropy on the anatase-to-rutile phase transformation of TiO2 thin films deposited by ion beam sputtering [Internet]. ACS Omega. 2020 ; No 2020( 43): 28027-28036.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1021/acsomega.0c03431

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