Filtros : "Universidade Federal de Mato Grosso do Sul (UFMS)" "EESC-SEM" "Journal of the Brazilian Society of Mechanical Sciences and Engineering" Removidos: "Imunologia" "ENFERMAGEM" "Japão" Limpar

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  • Source: Journal of the Brazilian Society of Mechanical Sciences and Engineering. Unidade: EESC

    Subjects: MUDANÇA DE FASE, ESPECTROSCOPIA RAMAN

    Acesso à fonteDOIHow to cite
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    • ABNT

      JASINEVICIUS, Renato Goulart et al. Multiple phase silicon in submicrometer chips removed by diamond turning. Journal of the Brazilian Society of Mechanical Sciences and Engineering, v. 27, n. 4, p. 440-448, 2005Tradução . . Disponível em: https://doi.org/10.1590/s1678-58782005000400013. Acesso em: 04 nov. 2024.
    • APA

      Jasinevicius, R. G., Porto, A. J. V., Duduch, J. G., Pizani, P. S., Lanciotti Junior, F., & Santos, F. J. dos. (2005). Multiple phase silicon in submicrometer chips removed by diamond turning. Journal of the Brazilian Society of Mechanical Sciences and Engineering, 27( 4), 440-448. doi:10.1590/s1678-58782005000400013
    • NLM

      Jasinevicius RG, Porto AJV, Duduch JG, Pizani PS, Lanciotti Junior F, Santos FJ dos. Multiple phase silicon in submicrometer chips removed by diamond turning [Internet]. Journal of the Brazilian Society of Mechanical Sciences and Engineering. 2005 ; 27( 4): 440-448.[citado 2024 nov. 04 ] Available from: https://doi.org/10.1590/s1678-58782005000400013
    • Vancouver

      Jasinevicius RG, Porto AJV, Duduch JG, Pizani PS, Lanciotti Junior F, Santos FJ dos. Multiple phase silicon in submicrometer chips removed by diamond turning [Internet]. Journal of the Brazilian Society of Mechanical Sciences and Engineering. 2005 ; 27( 4): 440-448.[citado 2024 nov. 04 ] Available from: https://doi.org/10.1590/s1678-58782005000400013

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